Abstract
This paper investigates and reports on the susceptibility of commercial voltage references to electromagnetic interference (EMI). Two separate scenarios have been considered. In the first experiment, the interferences are directly injected onto the power supply lines of each voltage reference. In the second measurement, EMI is capacitively coupled to all the pins of the voltage reference under test, including the output, hereby emulating the presence of a neighbouring noisy printed circuit board (PCB) trace. These measurements show that the resulting EMI-induced offset can attain considerable values at critical EMI frequencies, ranging from 30MHz to 100MHz when the EMI is injected into the power supply rails, and 300MHz to 500MHz when EMI is capacitively coupled to all the pins.
Original language | English |
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Title of host publication | 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017) |
Subtitle of host publication | Saint Petersburg, Russia 4-8 July 2017 |
Editors | S. Shaposhnikov |
Place of Publication | Piscataway NJ USA |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 162-167 |
Number of pages | 6 |
ISBN (Electronic) | 9781538626894 |
ISBN (Print) | 9781538626900 |
DOIs | |
Publication status | Published - 31 Jul 2017 |
Event | International Workshop on the Electromagnetic Compatibility of Integrated Circuits 2017 - St. Petersburg, Russian Federation Duration: 4 Jul 2017 → 8 Jul 2017 Conference number: 11th https://emccompo2017.eltech.ru/ |
Conference
Conference | International Workshop on the Electromagnetic Compatibility of Integrated Circuits 2017 |
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Abbreviated title | EMC Compo 2017 |
Country/Territory | Russian Federation |
City | St. Petersburg |
Period | 4/07/17 → 8/07/17 |
Internet address |
Keywords
- Electromagnetic immunity
- mixed-signal integrated circuits
- series and shunt references
- voltage reference circuits