Measurements of EMI susceptibility of precision voltage references

A. Richelli, L. Colalongo, L. Toninelli, I. Rusu, J. M. Redouté

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

3 Citations (Scopus)

Abstract

This paper investigates and reports on the susceptibility of commercial voltage references to electromagnetic interference (EMI). Two separate scenarios have been considered. In the first experiment, the interferences are directly injected onto the power supply lines of each voltage reference. In the second measurement, EMI is capacitively coupled to all the pins of the voltage reference under test, including the output, hereby emulating the presence of a neighbouring noisy printed circuit board (PCB) trace. These measurements show that the resulting EMI-induced offset can attain considerable values at critical EMI frequencies, ranging from 30MHz to 100MHz when the EMI is injected into the power supply rails, and 300MHz to 500MHz when EMI is capacitively coupled to all the pins.

Original languageEnglish
Title of host publication2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017)
Subtitle of host publicationSaint Petersburg, Russia 4-8 July 2017
EditorsS. Shaposhnikov
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages162-167
Number of pages6
ISBN (Electronic)9781538626894
ISBN (Print)9781538626900
DOIs
Publication statusPublished - 31 Jul 2017
EventInternational Workshop on the Electromagnetic Compatibility of Integrated Circuits 2017 - St. Petersburg, Russian Federation
Duration: 4 Jul 20178 Jul 2017
Conference number: 11th
https://emccompo2017.eltech.ru/

Conference

ConferenceInternational Workshop on the Electromagnetic Compatibility of Integrated Circuits 2017
Abbreviated titleEMC Compo 2017
CountryRussian Federation
CitySt. Petersburg
Period4/07/178/07/17
Internet address

Keywords

  • Electromagnetic immunity
  • mixed-signal integrated circuits
  • series and shunt references
  • voltage reference circuits

Cite this