Measurements of EMI susceptibility of precision voltage references

A. Richelli; L. Colalongo; L. Toninelli; I. Rusu; J. M. Redouté

doi:10.1109/EMCCompo.2017.7998103

Measurements of EMI susceptibility of precision voltage references

A. Richelli, L. Colalongo, L. Toninelli, I. Rusu, J. M. Redouté

Electrical and Computer Systems Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

9 Citations (Scopus)

Abstract

This paper investigates and reports on the susceptibility of commercial voltage references to electromagnetic interference (EMI). Two separate scenarios have been considered. In the first experiment, the interferences are directly injected onto the power supply lines of each voltage reference. In the second measurement, EMI is capacitively coupled to all the pins of the voltage reference under test, including the output, hereby emulating the presence of a neighbouring noisy printed circuit board (PCB) trace. These measurements show that the resulting EMI-induced offset can attain considerable values at critical EMI frequencies, ranging from 30MHz to 100MHz when the EMI is injected into the power supply rails, and 300MHz to 500MHz when EMI is capacitively coupled to all the pins.

Original language	English
Title of host publication	2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017)
Subtitle of host publication	Saint Petersburg, Russia 4-8 July 2017
Editors	S. Shaposhnikov
Place of Publication	Piscataway NJ USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	162-167
Number of pages	6
ISBN (Electronic)	9781538626894
ISBN (Print)	9781538626900
DOIs	https://doi.org/10.1109/EMCCompo.2017.7998103
Publication status	Published - 31 Jul 2017
Event	International Workshop on the Electromagnetic Compatibility of Integrated Circuits 2017 - St. Petersburg, Russian Federation Duration: 4 Jul 2017 → 8 Jul 2017 Conference number: 11th https://emccompo2017.eltech.ru/

Conference

Conference	International Workshop on the Electromagnetic Compatibility of Integrated Circuits 2017
Abbreviated title	EMC Compo 2017
Country/Territory	Russian Federation
City	St. Petersburg
Period	4/07/17 → 8/07/17
Internet address	https://emccompo2017.eltech.ru/

Keywords

Electromagnetic immunity
mixed-signal integrated circuits
series and shunt references
voltage reference circuits

Access to Document

10.1109/EMCCompo.2017.7998103

Cite this

Richelli, A., Colalongo, L., Toninelli, L., Rusu, I., & Redouté, J. M. (2017). Measurements of EMI susceptibility of precision voltage references. In S. Shaposhnikov (Ed.), 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017): Saint Petersburg, Russia 4-8 July 2017 (pp. 162-167). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCCompo.2017.7998103

Richelli, A. ; Colalongo, L. ; Toninelli, L. et al. / Measurements of EMI susceptibility of precision voltage references. 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017): Saint Petersburg, Russia 4-8 July 2017. editor / S. Shaposhnikov. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2017. pp. 162-167

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title = "Measurements of EMI susceptibility of precision voltage references",

abstract = "This paper investigates and reports on the susceptibility of commercial voltage references to electromagnetic interference (EMI). Two separate scenarios have been considered. In the first experiment, the interferences are directly injected onto the power supply lines of each voltage reference. In the second measurement, EMI is capacitively coupled to all the pins of the voltage reference under test, including the output, hereby emulating the presence of a neighbouring noisy printed circuit board (PCB) trace. These measurements show that the resulting EMI-induced offset can attain considerable values at critical EMI frequencies, ranging from 30MHz to 100MHz when the EMI is injected into the power supply rails, and 300MHz to 500MHz when EMI is capacitively coupled to all the pins.",

keywords = "Electromagnetic immunity, mixed-signal integrated circuits, series and shunt references, voltage reference circuits",

author = "A. Richelli and L. Colalongo and L. Toninelli and I. Rusu and Redout{\'e}, {J. M.}",

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Richelli, A, Colalongo, L, Toninelli, L, Rusu, I & Redouté, JM 2017, Measurements of EMI susceptibility of precision voltage references. in S Shaposhnikov (ed.), 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017): Saint Petersburg, Russia 4-8 July 2017. IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. 162-167, International Workshop on the Electromagnetic Compatibility of Integrated Circuits 2017, St. Petersburg, Russian Federation, 4/07/17. https://doi.org/10.1109/EMCCompo.2017.7998103

Measurements of EMI susceptibility of precision voltage references. / Richelli, A.; Colalongo, L.; Toninelli, L. et al.
2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017): Saint Petersburg, Russia 4-8 July 2017. ed. / S. Shaposhnikov. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, 2017. p. 162-167.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

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T1 - Measurements of EMI susceptibility of precision voltage references

AU - Richelli, A.

AU - Colalongo, L.

AU - Toninelli, L.

AU - Rusu, I.

AU - Redouté, J. M.

N1 - Conference code: 11th

PY - 2017/7/31

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N2 - This paper investigates and reports on the susceptibility of commercial voltage references to electromagnetic interference (EMI). Two separate scenarios have been considered. In the first experiment, the interferences are directly injected onto the power supply lines of each voltage reference. In the second measurement, EMI is capacitively coupled to all the pins of the voltage reference under test, including the output, hereby emulating the presence of a neighbouring noisy printed circuit board (PCB) trace. These measurements show that the resulting EMI-induced offset can attain considerable values at critical EMI frequencies, ranging from 30MHz to 100MHz when the EMI is injected into the power supply rails, and 300MHz to 500MHz when EMI is capacitively coupled to all the pins.

AB - This paper investigates and reports on the susceptibility of commercial voltage references to electromagnetic interference (EMI). Two separate scenarios have been considered. In the first experiment, the interferences are directly injected onto the power supply lines of each voltage reference. In the second measurement, EMI is capacitively coupled to all the pins of the voltage reference under test, including the output, hereby emulating the presence of a neighbouring noisy printed circuit board (PCB) trace. These measurements show that the resulting EMI-induced offset can attain considerable values at critical EMI frequencies, ranging from 30MHz to 100MHz when the EMI is injected into the power supply rails, and 300MHz to 500MHz when EMI is capacitively coupled to all the pins.

KW - Electromagnetic immunity

KW - mixed-signal integrated circuits

KW - series and shunt references

KW - voltage reference circuits

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BT - 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017)

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Richelli A, Colalongo L, Toninelli L, Rusu I, Redouté JM. Measurements of EMI susceptibility of precision voltage references. In Shaposhnikov S, editor, 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo 2017): Saint Petersburg, Russia 4-8 July 2017. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. 2017. p. 162-167 doi: 10.1109/EMCCompo.2017.7998103

Measurements of EMI susceptibility of precision voltage references

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Keywords

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