Measurement of wheat grain thickness using profilometry

M Berman, D A Coward, L B Whitbourn, B G Osbourne, C J Evans, P M Connor, Richard Beare, R N Phillips, R Quodling

Research output: Contribution to journalArticleResearchpeer-review

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)282 - 284
Number of pages3
JournalCereal Chemistry
Volume84
Issue number3
DOIs
Publication statusPublished - 2007

Cite this

Berman, M., Coward, D. A., Whitbourn, L. B., Osbourne, B. G., Evans, C. J., Connor, P. M., Beare, R., Phillips, R. N., & Quodling, R. (2007). Measurement of wheat grain thickness using profilometry. Cereal Chemistry, 84(3), 282 - 284. https://doi.org/10.1094/CCHEM-84-3-0282