Measurement of retardance variations over the apertures of liquid-crystal variable retarders

Claudio N. Ramirez; Neil C. Bruce; Juan M. Lopez-Tellez; Oscar G. Rodriguez-Herrera; Martha Rosete-Aguilar

doi:10.1117/12.2568645

Measurement of retardance variations over the apertures of liquid-crystal variable retarders

Claudio N. Ramirez, Neil C. Bruce, Juan M. Lopez-Tellez, Oscar G. Rodriguez-Herrera, Martha Rosete-Aguilar

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Abstract

Variations of the induced retardance in the aperture of liquid-crystal variable retarders LCVR and spatial light modulators LC-SLM are measured. It is found that the induced retardance, in LCVR, shows variations over the aperture which depend on the wavelength of the light used and the voltage applied. Larger retardance variations appear near to the edges of the cell. There are also larger variations in the maximum and minimum unwrapped retardances in the retardance versus voltage curves. These voltage values and the edges positions of the cells should be avoided in applications of these devices. On the other hand, the induced retardance is calculated pixel by pixel in LC-SLM. For the same gray level over the entire LC-SLM screen, there are differences in the induced retardance between pixels located in a central area and pixels located in the edges. For correct calibration of the LC-SLM, the retardance value as a function of gray level was determined, pixel by pixel.

Original language	English
Title of host publication	Proceedings of SPIE - Optical Manufacturing and Testing XIII
Editors	Dae Wook Kim, Rolf Rascher
Place of Publication	Bellingham Washington USA
Publisher	SPIE - International Society for Optical Engineering
Number of pages	12
ISBN (Electronic)	9781510637801
ISBN (Print)	9781510637801
DOIs	https://doi.org/10.1117/12.2568645
Publication status	Published - 2020
Externally published	Yes
Event	Conference on Optical Manufacturing and Testing XIII 2020 - Online, United States of America Duration: 24 Aug 2020 → 4 Sept 2020 https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11487.toc (Proceedings)

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Publisher	SPIE - International Society for Optical Engineering
Volume	11487
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Conference on Optical Manufacturing and Testing XIII 2020
Country/Territory	United States of America
Period	24/08/20 → 4/09/20
Internet address	https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11487.toc (Proceedings)

Keywords

Polarimetry
Polarization imaging
Polarization optics
Retardance variations
Spatial light modulator
Variable retarder

Access to Document

10.1117/12.2568645

Cite this

Ramirez, C. N., Bruce, N. C., Lopez-Tellez, J. M., Rodriguez-Herrera, O. G., & Rosete-Aguilar, M. (2020). Measurement of retardance variations over the apertures of liquid-crystal variable retarders. In D. W. Kim, & R. Rascher (Eds.), Proceedings of SPIE - Optical Manufacturing and Testing XIII Article 114871O (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11487). SPIE - International Society for Optical Engineering. https://doi.org/10.1117/12.2568645

Ramirez, Claudio N. ; Bruce, Neil C. ; Lopez-Tellez, Juan M. et al. / Measurement of retardance variations over the apertures of liquid-crystal variable retarders. Proceedings of SPIE - Optical Manufacturing and Testing XIII. editor / Dae Wook Kim ; Rolf Rascher. Bellingham Washington USA : SPIE - International Society for Optical Engineering, 2020. (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{cd9c51e63db74c94bde21972e60b28a5,

title = "Measurement of retardance variations over the apertures of liquid-crystal variable retarders",

abstract = "Variations of the induced retardance in the aperture of liquid-crystal variable retarders LCVR and spatial light modulators LC-SLM are measured. It is found that the induced retardance, in LCVR, shows variations over the aperture which depend on the wavelength of the light used and the voltage applied. Larger retardance variations appear near to the edges of the cell. There are also larger variations in the maximum and minimum unwrapped retardances in the retardance versus voltage curves. These voltage values and the edges positions of the cells should be avoided in applications of these devices. On the other hand, the induced retardance is calculated pixel by pixel in LC-SLM. For the same gray level over the entire LC-SLM screen, there are differences in the induced retardance between pixels located in a central area and pixels located in the edges. For correct calibration of the LC-SLM, the retardance value as a function of gray level was determined, pixel by pixel.",

keywords = "Polarimetry, Polarization imaging, Polarization optics, Retardance variations, Spatial light modulator, Variable retarder",

author = "Ramirez, {Claudio N.} and Bruce, {Neil C.} and Lopez-Tellez, {Juan M.} and Rodriguez-Herrera, {Oscar G.} and Martha Rosete-Aguilar",

note = "Funding Information: We acknowledge funding for this research from DGAPA-UNAM through projects PAPIIT IT100114, IT100417, and TA101020. Juan Manuel L{\'o}pez T´ellez acknowledges a postdoctoral grant from CONACyT Mexico. Publisher Copyright: {\textcopyright} 2020 SPIE.; Conference on Optical Manufacturing and Testing XIII 2020 ; Conference date: 24-08-2020 Through 04-09-2020",

year = "2020",

doi = "10.1117/12.2568645",

language = "English",

isbn = "9781510637801",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE - International Society for Optical Engineering",

editor = "Kim, {Dae Wook} and Rolf Rascher",

booktitle = "Proceedings of SPIE - Optical Manufacturing and Testing XIII",

address = "United States of America",

url = "https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11487.toc",

}

Ramirez, CN, Bruce, NC, Lopez-Tellez, JM, Rodriguez-Herrera, OG & Rosete-Aguilar, M 2020, Measurement of retardance variations over the apertures of liquid-crystal variable retarders. in DW Kim & R Rascher (eds), Proceedings of SPIE - Optical Manufacturing and Testing XIII., 114871O, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11487, SPIE - International Society for Optical Engineering, Bellingham Washington USA, Conference on Optical Manufacturing and Testing XIII 2020, United States of America, 24/08/20. https://doi.org/10.1117/12.2568645

Measurement of retardance variations over the apertures of liquid-crystal variable retarders. / Ramirez, Claudio N.; Bruce, Neil C.; Lopez-Tellez, Juan M. et al.
Proceedings of SPIE - Optical Manufacturing and Testing XIII. ed. / Dae Wook Kim; Rolf Rascher. Bellingham Washington USA: SPIE - International Society for Optical Engineering, 2020. 114871O (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11487).

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Measurement of retardance variations over the apertures of liquid-crystal variable retarders

AU - Ramirez, Claudio N.

AU - Bruce, Neil C.

AU - Lopez-Tellez, Juan M.

AU - Rodriguez-Herrera, Oscar G.

AU - Rosete-Aguilar, Martha

N1 - Funding Information: We acknowledge funding for this research from DGAPA-UNAM through projects PAPIIT IT100114, IT100417, and TA101020. Juan Manuel López T´ellez acknowledges a postdoctoral grant from CONACyT Mexico. Publisher Copyright: © 2020 SPIE.

PY - 2020

Y1 - 2020

N2 - Variations of the induced retardance in the aperture of liquid-crystal variable retarders LCVR and spatial light modulators LC-SLM are measured. It is found that the induced retardance, in LCVR, shows variations over the aperture which depend on the wavelength of the light used and the voltage applied. Larger retardance variations appear near to the edges of the cell. There are also larger variations in the maximum and minimum unwrapped retardances in the retardance versus voltage curves. These voltage values and the edges positions of the cells should be avoided in applications of these devices. On the other hand, the induced retardance is calculated pixel by pixel in LC-SLM. For the same gray level over the entire LC-SLM screen, there are differences in the induced retardance between pixels located in a central area and pixels located in the edges. For correct calibration of the LC-SLM, the retardance value as a function of gray level was determined, pixel by pixel.

AB - Variations of the induced retardance in the aperture of liquid-crystal variable retarders LCVR and spatial light modulators LC-SLM are measured. It is found that the induced retardance, in LCVR, shows variations over the aperture which depend on the wavelength of the light used and the voltage applied. Larger retardance variations appear near to the edges of the cell. There are also larger variations in the maximum and minimum unwrapped retardances in the retardance versus voltage curves. These voltage values and the edges positions of the cells should be avoided in applications of these devices. On the other hand, the induced retardance is calculated pixel by pixel in LC-SLM. For the same gray level over the entire LC-SLM screen, there are differences in the induced retardance between pixels located in a central area and pixels located in the edges. For correct calibration of the LC-SLM, the retardance value as a function of gray level was determined, pixel by pixel.

KW - Polarimetry

KW - Polarization imaging

KW - Polarization optics

KW - Retardance variations

KW - Spatial light modulator

KW - Variable retarder

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M3 - Conference Paper

AN - SCOPUS:85092468712

SN - 9781510637801

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Proceedings of SPIE - Optical Manufacturing and Testing XIII

A2 - Kim, Dae Wook

A2 - Rascher, Rolf

PB - SPIE - International Society for Optical Engineering

CY - Bellingham Washington USA

T2 - Conference on Optical Manufacturing and Testing XIII 2020

Y2 - 24 August 2020 through 4 September 2020

ER -

Ramirez CN, Bruce NC, Lopez-Tellez JM, Rodriguez-Herrera OG, Rosete-Aguilar M. Measurement of retardance variations over the apertures of liquid-crystal variable retarders. In Kim DW, Rascher R, editors, Proceedings of SPIE - Optical Manufacturing and Testing XIII. Bellingham Washington USA: SPIE - International Society for Optical Engineering. 2020. 114871O. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2568645

Measurement of retardance variations over the apertures of liquid-crystal variable retarders

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Publication series

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Keywords

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