Material decomposition from a single x-ray projection via single-grid phase contrast imaging

Celebrity F. Groenendijk, Florian Schaff, Linda C.P. Croton, Marcus J. Kitchen, Kaye S. Morgan

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Abstract

This study describes a new approach for material decomposition in x-ray imaging, utilizing phase contrast both to increase sensitivity to weakly attenuating samples and to act as a complementary measurement to attenuation, therefore allowing two overlaid materials to be separated. The measurements are captured using the single-exposure, single-grid x-ray phase contrast imaging technique, with a novel correction that aims to remove propagation-based phase effects seen at sharp edges in the attenuation image. The use of a single-exposure technique means that images can be collected in a high-speed sequence. Results are shown for both a known two-material sample and for a biological specimen.

Original languageEnglish
Pages (from-to)4076-4079
Number of pages4
JournalOptics Letters
Volume45
Issue number14
DOIs
Publication statusPublished - 15 Jul 2020

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