Mapping fit: Maximizing idiographic and nomothetic benefits

Jon Billsberry, Danielle L Talbot, Veronique Ambrosini

Research output: Chapter in Book/Report/Conference proceedingChapter (Book)Researchpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publicationOrganizational Fit: Key Issues and New Directions
EditorsAmy L Kristof-Brown, Jon Billsberry
Place of PublicationChichester UK
PublisherWiley-Blackwell
Pages124 - 141
Number of pages18
Edition1st
ISBN (Print)9780470683613
Publication statusPublished - 2013

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