Machine fault severity estimation based on adaptive wavelet nodes selection and SVM

Muhammad Yaqub, Iqbal Gondal, Joarder Kamruzzaman

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    10 Citations (Scopus)
    Original languageEnglish
    Title of host publication2011 IEEE International Conference on Mechatronics and Automation (ICMA)
    EditorsHajime Asama, Desheng Li
    Place of PublicationPiscataway NJ USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages1951 - 1956
    Number of pages6
    ISBN (Print)9781424481149
    Publication statusPublished - 2011
    EventIEEE International Conference on Mechatronics and Automation 2011 - Beijing, China
    Duration: 7 Aug 201110 Aug 2011
    http://2011.ieee-icma.org/

    Conference

    ConferenceIEEE International Conference on Mechatronics and Automation 2011
    Abbreviated titleICMA 2011
    CountryChina
    CityBeijing
    Period7/08/1110/08/11
    Internet address

    Cite this

    Yaqub, M., Gondal, I., & Kamruzzaman, J. (2011). Machine fault severity estimation based on adaptive wavelet nodes selection and SVM. In H. Asama, & D. Li (Eds.), 2011 IEEE International Conference on Mechatronics and Automation (ICMA) (pp. 1951 - 1956). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers.
    Yaqub, Muhammad ; Gondal, Iqbal ; Kamruzzaman, Joarder. / Machine fault severity estimation based on adaptive wavelet nodes selection and SVM. 2011 IEEE International Conference on Mechatronics and Automation (ICMA). editor / Hajime Asama ; Desheng Li. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2011. pp. 1951 - 1956
    @inproceedings{5f7fcaa81a70482ebc2f66b3e5bf738c,
    title = "Machine fault severity estimation based on adaptive wavelet nodes selection and SVM",
    author = "Muhammad Yaqub and Iqbal Gondal and Joarder Kamruzzaman",
    year = "2011",
    language = "English",
    isbn = "9781424481149",
    pages = "1951 -- 1956",
    editor = "Hajime Asama and Desheng Li",
    booktitle = "2011 IEEE International Conference on Mechatronics and Automation (ICMA)",
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    address = "United States of America",

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    Yaqub, M, Gondal, I & Kamruzzaman, J 2011, Machine fault severity estimation based on adaptive wavelet nodes selection and SVM. in H Asama & D Li (eds), 2011 IEEE International Conference on Mechatronics and Automation (ICMA). IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. 1951 - 1956, IEEE International Conference on Mechatronics and Automation 2011, Beijing, China, 7/08/11.

    Machine fault severity estimation based on adaptive wavelet nodes selection and SVM. / Yaqub, Muhammad; Gondal, Iqbal; Kamruzzaman, Joarder.

    2011 IEEE International Conference on Mechatronics and Automation (ICMA). ed. / Hajime Asama; Desheng Li. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2011. p. 1951 - 1956.

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    TY - GEN

    T1 - Machine fault severity estimation based on adaptive wavelet nodes selection and SVM

    AU - Yaqub, Muhammad

    AU - Gondal, Iqbal

    AU - Kamruzzaman, Joarder

    PY - 2011

    Y1 - 2011

    M3 - Conference Paper

    SN - 9781424481149

    SP - 1951

    EP - 1956

    BT - 2011 IEEE International Conference on Mechatronics and Automation (ICMA)

    A2 - Asama, Hajime

    A2 - Li, Desheng

    PB - IEEE, Institute of Electrical and Electronics Engineers

    CY - Piscataway NJ USA

    ER -

    Yaqub M, Gondal I, Kamruzzaman J. Machine fault severity estimation based on adaptive wavelet nodes selection and SVM. In Asama H, Li D, editors, 2011 IEEE International Conference on Mechatronics and Automation (ICMA). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. 2011. p. 1951 - 1956