Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probes

Daniel Joel Taplin, Naoya Shibata, Matthew Weyland, Scott Findlay

Research output: Contribution to journalArticleResearchpeer-review

3 Citations (Scopus)

Abstract

To correlate atomistic structure with longer range electric field distribution within materials, it is necessary to use atomically fine electron probes and specimens in on-axis orientation. However, electric field mapping via low magnification differential phase contrast imaging under these conditions raises challenges: electron scattering tends to reduce the beam deflection due to the electric field strength from what simple models predict, and other effects, most notably crystal mistilt, can lead to asymmetric intensity redistribution in the diffraction pattern which is difficult to distinguish from that produced by long range electric fields. Using electron scattering simulations, we explore the effects of such factors on the reliable interpretation and measurement of electric field distributions. In addition to these limitations of principle, some limitations of practice when seeking to perform such measurements using segmented detector systems are also discussed.
Original languageEnglish
Pages (from-to)69-79
Number of pages11
JournalUltramicroscopy
Volume169
DOIs
Publication statusPublished - 2016

Cite this

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title = "Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probes",
abstract = "To correlate atomistic structure with longer range electric field distribution within materials, it is necessary to use atomically fine electron probes and specimens in on-axis orientation. However, electric field mapping via low magnification differential phase contrast imaging under these conditions raises challenges: electron scattering tends to reduce the beam deflection due to the electric field strength from what simple models predict, and other effects, most notably crystal mistilt, can lead to asymmetric intensity redistribution in the diffraction pattern which is difficult to distinguish from that produced by long range electric fields. Using electron scattering simulations, we explore the effects of such factors on the reliable interpretation and measurement of electric field distributions. In addition to these limitations of principle, some limitations of practice when seeking to perform such measurements using segmented detector systems are also discussed.",
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Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probes. / Taplin, Daniel Joel; Shibata, Naoya; Weyland, Matthew; Findlay, Scott.

In: Ultramicroscopy, Vol. 169, 2016, p. 69-79.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probes

AU - Taplin, Daniel Joel

AU - Shibata, Naoya

AU - Weyland, Matthew

AU - Findlay, Scott

PY - 2016

Y1 - 2016

N2 - To correlate atomistic structure with longer range electric field distribution within materials, it is necessary to use atomically fine electron probes and specimens in on-axis orientation. However, electric field mapping via low magnification differential phase contrast imaging under these conditions raises challenges: electron scattering tends to reduce the beam deflection due to the electric field strength from what simple models predict, and other effects, most notably crystal mistilt, can lead to asymmetric intensity redistribution in the diffraction pattern which is difficult to distinguish from that produced by long range electric fields. Using electron scattering simulations, we explore the effects of such factors on the reliable interpretation and measurement of electric field distributions. In addition to these limitations of principle, some limitations of practice when seeking to perform such measurements using segmented detector systems are also discussed.

AB - To correlate atomistic structure with longer range electric field distribution within materials, it is necessary to use atomically fine electron probes and specimens in on-axis orientation. However, electric field mapping via low magnification differential phase contrast imaging under these conditions raises challenges: electron scattering tends to reduce the beam deflection due to the electric field strength from what simple models predict, and other effects, most notably crystal mistilt, can lead to asymmetric intensity redistribution in the diffraction pattern which is difficult to distinguish from that produced by long range electric fields. Using electron scattering simulations, we explore the effects of such factors on the reliable interpretation and measurement of electric field distributions. In addition to these limitations of principle, some limitations of practice when seeking to perform such measurements using segmented detector systems are also discussed.

U2 - 10.1016/j.ultramic.2016.07.010

DO - 10.1016/j.ultramic.2016.07.010

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VL - 169

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EP - 79

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

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