Projects per year
Abstract
To correlate atomistic structure with longer range electric field distribution within materials, it is necessary to use atomically fine electron probes and specimens in on-axis orientation. However, electric field mapping via low magnification differential phase contrast imaging under these conditions raises challenges: electron scattering tends to reduce the beam deflection due to the electric field strength from what simple models predict, and other effects, most notably crystal mistilt, can lead to asymmetric intensity redistribution in the diffraction pattern which is difficult to distinguish from that produced by long range electric fields. Using electron scattering simulations, we explore the effects of such factors on the reliable interpretation and measurement of electric field distributions. In addition to these limitations of principle, some limitations of practice when seeking to perform such measurements using segmented detector systems are also discussed.
Original language | English |
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Pages (from-to) | 69-79 |
Number of pages | 11 |
Journal | Ultramicroscopy |
Volume | 169 |
DOIs | |
Publication status | Published - 2016 |
Projects
- 2 Finished
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Nanoscale field mapping in functional materials
Findlay, S., Morgan, M., Paganin, D., Petersen, T. & Shibata, N.
Australian Research Council (ARC), Monash University, University of Tokyo
26/05/16 → 30/06/21
Project: Research
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Making every electron count in atomic resolution microscopy
Findlay, S., Allen, L., D'Alfonso, A. & Weyland, M.
Australian Research Council (ARC), Monash University
2/01/14 → 1/06/18
Project: Research