Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 69-79 |
| Number of pages | 11 |
| Journal | Ultramicroscopy |
| Volume | 169 |
| DOIs | |
| Publication status | Published - 2016 |
Cite this
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Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probes. / Taplin, Daniel Joel; Shibata, Naoya; Weyland, Matthew; Findlay, Scott.
In: Ultramicroscopy, Vol. 169, 2016, p. 69-79.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probes
AU - Taplin, Daniel Joel
AU - Shibata, Naoya
AU - Weyland, Matthew
AU - Findlay, Scott
PY - 2016
Y1 - 2016
N2 - To correlate atomistic structure with longer range electric field distribution within materials, it is necessary to use atomically fine electron probes and specimens in on-axis orientation. However, electric field mapping via low magnification differential phase contrast imaging under these conditions raises challenges: electron scattering tends to reduce the beam deflection due to the electric field strength from what simple models predict, and other effects, most notably crystal mistilt, can lead to asymmetric intensity redistribution in the diffraction pattern which is difficult to distinguish from that produced by long range electric fields. Using electron scattering simulations, we explore the effects of such factors on the reliable interpretation and measurement of electric field distributions. In addition to these limitations of principle, some limitations of practice when seeking to perform such measurements using segmented detector systems are also discussed.
AB - To correlate atomistic structure with longer range electric field distribution within materials, it is necessary to use atomically fine electron probes and specimens in on-axis orientation. However, electric field mapping via low magnification differential phase contrast imaging under these conditions raises challenges: electron scattering tends to reduce the beam deflection due to the electric field strength from what simple models predict, and other effects, most notably crystal mistilt, can lead to asymmetric intensity redistribution in the diffraction pattern which is difficult to distinguish from that produced by long range electric fields. Using electron scattering simulations, we explore the effects of such factors on the reliable interpretation and measurement of electric field distributions. In addition to these limitations of principle, some limitations of practice when seeking to perform such measurements using segmented detector systems are also discussed.
U2 - 10.1016/j.ultramic.2016.07.010
DO - 10.1016/j.ultramic.2016.07.010
M3 - Article
VL - 169
SP - 69
EP - 79
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
ER -