Skip to main navigation Skip to search Skip to main content

Localized Motion Artifact Reduction on Brain MRI Using Deep Learning with Effective Data Augmentation Techniques

  • Yijun Zhao
  • , Jacek Ossowski
  • , Xuming Wang
  • , Shangjin Li
  • , Orrin Devinsky
  • , Samantha P. Martin
  • , Heath R. Pardoe

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Abstract

In-scanner motion degrades the quality of magnetic resonance imaging (MRI) thereby reducing its utility in the detection of clinically relevant abnormalities. We collaborate with doctors from NYU Langone's Comprehensive Epilepsy Center and apply a deep learning-based MRI artifact reduction model (DMAR) to correct head motion artifacts in brain MRI scans. Specifically, DMAR employs a two-stage approach: in the first, degraded regions are detected using the Single Shot Multibox Detector (SSD), and in the second, the artifacts within the found regions are reduced using a convolutional autoencoder (CAE). We further introduce a set of novel data augmentation techniques to address the high dimensionality of MRI images and the scarcity of available data. As a result, our model was trained on a large synthetic dataset of 225, 000 images generated using 375 whole brain T1-weighted MRI scans from the OASIS-1 dataset. DMAR visibly reduces image artifacts when validated using real-world artifact-affected scans from the multi-center ABIDE study and proprietary data collected at NYU. Quantitatively, depending on the level of degradation, our model achieves a 27.8%-48.1% reduction in RMSE and a 2.88-5.79 dB gain in PSNR on a 5000-sample set of synthetic images. For real-world data without ground-truth, our model reduced the variance of image voxel intensity within artifact-affected brain regions (mathrmp=0.014).

Original languageEnglish
Title of host publication2021 International Joint Conference on Neural Networks, (IJCNN) Proceedings
EditorsLong Chen, Yue Cui
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Number of pages9
ISBN (Electronic)9780738133669
ISBN (Print)9781665445979
DOIs
Publication statusPublished - 18 Jul 2021
Externally publishedYes
EventIEEE International Joint Conference on Neural Networks 2021 - Online, Shenzhen, China
Duration: 18 Jul 202122 Jul 2021
https://ieeexplore.ieee.org/xpl/conhome/9533266/proceeding (Proceedings)
https://ijcnn.org/2021 (Website)

Publication series

NameProceedings of the International Joint Conference on Neural Networks
Volume2021-July
ISSN (Print)2161-4393
ISSN (Electronic)2161-4407

Conference

ConferenceIEEE International Joint Conference on Neural Networks 2021
Abbreviated titleIJCNN 2021
Country/TerritoryChina
CityShenzhen
Period18/07/2122/07/21
Internet address

Keywords

  • deep learning
  • k-space
  • motion artifact reduction
  • MRI
  • object detection

Cite this