Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy

Takehito Seki; Kushagra Khare; Yoshiki O. Murakami; Satoko Toyama; Gabriel Sánchez-Santolino; Hirokazu Sasaki; Scott D. Findlay; Timothy C. Petersen; Yuichi Ikuhara; Naoya Shibata

doi:10.1016/j.ultramic.2022.113580

Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy

Takehito Seki, Kushagra Khare, Yoshiki O. Murakami, Satoko Toyama, Gabriel Sánchez-Santolino, Hirokazu Sasaki, Scott D. Findlay, Timothy C. Petersen, Yuichi Ikuhara, Naoya Shibata

Research output: Contribution to journal › Article › Research › peer-review

11 Citations (Scopus)

Abstract

We propose a linear imaging theory for differential phase contrast under the weak-phase-weak-amplitude object approximation. Contrast transfer functions are defined for thin and thick weak objects, and they successfully describe several imaging characteristics of differential phase contrast. We discuss the defocus dependence of the contrast for several examples: atomic resolution, a p-n junction, a heterointerface, and grain boundaries. Understanding the imaging characteristics helps in adjusting aberrations in DPC STEM.

Original language	English
Article number	113580
Number of pages	11
Journal	Ultramicroscopy
Volume	240
DOIs	https://doi.org/10.1016/j.ultramic.2022.113580
Publication status	Published - Oct 2022

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10.1016/j.ultramic.2022.113580

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@article{0cb9be7690484fdda54d7b2b6d33dc01,

title = "Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy",

abstract = "We propose a linear imaging theory for differential phase contrast under the weak-phase-weak-amplitude object approximation. Contrast transfer functions are defined for thin and thick weak objects, and they successfully describe several imaging characteristics of differential phase contrast. We discuss the defocus dependence of the contrast for several examples: atomic resolution, a p-n junction, a heterointerface, and grain boundaries. Understanding the imaging characteristics helps in adjusting aberrations in DPC STEM.",

author = "Takehito Seki and Kushagra Khare and Murakami, \{Yoshiki O.\} and Satoko Toyama and Gabriel S{\'a}nchez-Santolino and Hirokazu Sasaki and Findlay, \{Scott D.\} and Petersen, \{Timothy C.\} and Yuichi Ikuhara and Naoya Shibata",

note = "Funding Information: We thank Y. Kanitani and S. Tomiya for providing the TEM specimen of GaN-based quantum wells, and A. Kinoshita and T. Shoji for providing the hot-pressed Nd-Fe-B magnet. This research was supported by the JSPS KAKENHI (JP20H05659, JP17H06094, and JP19H05788). T.S. acknowledges support from JST PRESTO (JPMJPR21AA), JSPS KAKENHI (JP20K15014), and the Kazato Research Foundation. Y.O.M and S.T. acknowledge support from Grant-in-Aid for JSPS research fellow (JP21J22546 and JP20J21517, respectively). This research was supported by the Australian Research Council Discovery Projects funding scheme (Project No. DP160102338). Publisher Copyright: {\textcopyright} 2022 Elsevier B.V.",

year = "2022",

month = oct,

doi = "10.1016/j.ultramic.2022.113580",

language = "English",

volume = "240",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier BV",

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TY - JOUR

T1 - Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy

AU - Seki, Takehito

AU - Khare, Kushagra

AU - Murakami, Yoshiki O.

AU - Toyama, Satoko

AU - Sánchez-Santolino, Gabriel

AU - Sasaki, Hirokazu

AU - Findlay, Scott D.

AU - Petersen, Timothy C.

AU - Ikuhara, Yuichi

AU - Shibata, Naoya

N1 - Funding Information: We thank Y. Kanitani and S. Tomiya for providing the TEM specimen of GaN-based quantum wells, and A. Kinoshita and T. Shoji for providing the hot-pressed Nd-Fe-B magnet. This research was supported by the JSPS KAKENHI (JP20H05659, JP17H06094, and JP19H05788). T.S. acknowledges support from JST PRESTO (JPMJPR21AA), JSPS KAKENHI (JP20K15014), and the Kazato Research Foundation. Y.O.M and S.T. acknowledge support from Grant-in-Aid for JSPS research fellow (JP21J22546 and JP20J21517, respectively). This research was supported by the Australian Research Council Discovery Projects funding scheme (Project No. DP160102338). Publisher Copyright: © 2022 Elsevier B.V.

PY - 2022/10

Y1 - 2022/10

N2 - We propose a linear imaging theory for differential phase contrast under the weak-phase-weak-amplitude object approximation. Contrast transfer functions are defined for thin and thick weak objects, and they successfully describe several imaging characteristics of differential phase contrast. We discuss the defocus dependence of the contrast for several examples: atomic resolution, a p-n junction, a heterointerface, and grain boundaries. Understanding the imaging characteristics helps in adjusting aberrations in DPC STEM.

AB - We propose a linear imaging theory for differential phase contrast under the weak-phase-weak-amplitude object approximation. Contrast transfer functions are defined for thin and thick weak objects, and they successfully describe several imaging characteristics of differential phase contrast. We discuss the defocus dependence of the contrast for several examples: atomic resolution, a p-n junction, a heterointerface, and grain boundaries. Understanding the imaging characteristics helps in adjusting aberrations in DPC STEM.

UR - https://www.scopus.com/pages/publications/85134891264

U2 - 10.1016/j.ultramic.2022.113580

DO - 10.1016/j.ultramic.2022.113580

M3 - Article

AN - SCOPUS:85134891264

SN - 0304-3991

VL - 240

JO - Ultramicroscopy

JF - Ultramicroscopy

M1 - 113580

ER -

Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy

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Nanoscale field mapping in functional materials

Monash Centre for Electron Microscopy (MCEM)

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Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy

Abstract

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Nanoscale field mapping in functional materials

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Monash Centre for Electron Microscopy (MCEM)

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