Light-emitting-diode inspection using a flatbed scanner

Han Yen Tan, Tuck Wah Ng

Research output: Contribution to journalArticleResearchpeer-review

7 Citations (Scopus)
Original languageEnglish
Pages (from-to)103602-1 - 103602-4
Number of pages4
JournalOptical Engineering
Volume47
Issue number10
Publication statusPublished - 2008

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