Light-emitting-diode inspection using a flatbed scanner

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@article{c499f6f3c2364f8bbd6705284b45cbf1,

title = "Light-emitting-diode inspection using a flatbed scanner",

author = "Tan, {Han Yen} and Ng, {Tuck Wah}",

year = "2008",

language = "English",

volume = "47",

pages = "103602--1 -- 103602--4",

journal = "Optical Engineering",

issn = "0091-3286",

publisher = "SPIE - International Society for Optical Engineering",

number = "10",

}