| Original language | English |
|---|---|
| Pages (from-to) | 103602-1 - 103602-4 |
| Number of pages | 4 |
| Journal | Optical Engineering |
| Volume | 47 |
| Issue number | 10 |
| Publication status | Published - 2008 |
Light-emitting-diode inspection using a flatbed scanner
Han Yen Tan, Tuck Wah Ng
Research output: Contribution to journal › Article › Research › peer-review
8
Citations
(Scopus)