Original language | English |
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Pages (from-to) | 307 - 323 |
Number of pages | 17 |
Journal | Machine Learning |
Volume | 71 |
Issue number | 2-3 |
Publication status | Published - 2008 |
Layered critical values: A powerful direct-adjustment approach to discovering significant patterns
Research output: Contribution to journal › Article › Research › peer-review
45
Citations
(Scopus)