Lateral force contrast for the detection of hydrophilic beads embedded within a PDMS surface

Peter Livingston, Tomoo Tsuzuki, Reinhard Boysen, Dan Nicolau

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Abstract

    The Atomic Force Microscope (AFM) has been used for the characterization of polydimethylsiloxane (PDMS) surfaces with embedded, randomly dispersed micron-sized glass beads as a model system for a nano-topographical composite material with adjacent hydrophobic/hydrophilic areas. The use of lateral force microscopy (LFM) for the differentiation of regions within a composite material allowed for a mapping of the position of the hydrophilic glass beads, the determination of the height of the protruding beads and the surface area of the glass. Material properties of the PDMS were obtained from AFM contact-mode scans, contact angle measurements and from Fourier transforrn infrared spectroscopy for both, unexposed surfaces and surfaces exposed for 3 hours with a 185 nm deep UV light source. The UV exposure was found to have an effect on the lateral force signal via a change in the stiffness of the PDMS but the resulting lower contrast was still sufficient for the discrimination of the different regions.
    Original languageEnglish
    Title of host publicationProceedings of the Society of Photo-Optical Instrumentation Engineers (SPIE)
    EditorsDan V Nicolau
    Place of PublicationUSA
    PublisherSPIE
    Pages41604 - 41604
    Number of pages1
    Volume6416
    ISBN (Print)0277-786X
    DOIs
    Publication statusPublished - 2007
    EventSPIE Biomedical Applications of Micro- and Nanoengineering - Adelaide Australia, USA
    Duration: 1 Jan 2007 → …

    Conference

    ConferenceSPIE Biomedical Applications of Micro- and Nanoengineering
    CityUSA
    Period1/01/07 → …

    Cite this

    Livingston, P., Tsuzuki, T., Boysen, R., & Nicolau, D. (2007). Lateral force contrast for the detection of hydrophilic beads embedded within a PDMS surface. In D. V. Nicolau (Ed.), Proceedings of the Society of Photo-Optical Instrumentation Engineers (SPIE) (Vol. 6416, pp. 41604 - 41604). SPIE. https://doi.org/10.117/12.707690