Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

H G Brown, Ryo Ishikawa, Gabriel Sánchez-Santolino, Naoya Shibata, Yuichi Ikuhara, L. J. Allen, S D Findlay

Research output: Contribution to journalArticleResearchpeer-review

1 Citation (Scopus)

Abstract

Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of Ångströms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)—a probe forming aperture with convergence angle larger than about 50 mrad—allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 Å.

Original languageEnglish
Pages (from-to)112-121
Number of pages10
JournalUltramicroscopy
Volume197
DOIs
Publication statusPublished - 1 Feb 2019

Keywords

  • Ptychography
  • Differential phase contrast
  • Scanning transmission electron microscopy

Cite this

Brown, H G ; Ishikawa, Ryo ; Sánchez-Santolino, Gabriel ; Shibata, Naoya ; Ikuhara, Yuichi ; Allen, L. J. ; Findlay, S D. / Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy. In: Ultramicroscopy. 2019 ; Vol. 197. pp. 112-121.
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Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy. / Brown, H G; Ishikawa, Ryo; Sánchez-Santolino, Gabriel; Shibata, Naoya; Ikuhara, Yuichi; Allen, L. J.; Findlay, S D.

In: Ultramicroscopy, Vol. 197, 01.02.2019, p. 112-121.

Research output: Contribution to journalArticleResearchpeer-review

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AU - Brown, H G

AU - Ishikawa, Ryo

AU - Sánchez-Santolino, Gabriel

AU - Shibata, Naoya

AU - Ikuhara, Yuichi

AU - Allen, L. J.

AU - Findlay, S D

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KW - Differential phase contrast

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