Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

H G Brown; Ryo Ishikawa; Gabriel Sánchez-Santolino; Naoya Shibata; Yuichi Ikuhara; L. J. Allen; S D Findlay

doi:10.1016/j.ultramic.2018.12.010

Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

H G Brown, Ryo Ishikawa, Gabriel Sánchez-Santolino, Naoya Shibata, Yuichi Ikuhara, L. J. Allen, S D Findlay

School of Physics and Astronomy

Research output: Contribution to journal › Article › Research › peer-review

9 Citations (Scopus)

Abstract

Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of Ångströms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)—a probe forming aperture with convergence angle larger than about 50 mrad—allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 Å.

Original language	English
Pages (from-to)	112-121
Number of pages	10
Journal	Ultramicroscopy
Volume	197
DOIs	https://doi.org/10.1016/j.ultramic.2018.12.010
Publication status	Published - 1 Feb 2019

Keywords

Ptychography
Differential phase contrast
Scanning transmission electron microscopy

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10.1016/j.ultramic.2018.12.010

258526057-oaAccepted author manuscript, 12.6 MBLicence: CC BY-NC-ND

Cite this

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title = "Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy",

abstract = "Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of {\AA}ngstr{\"o}ms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)—a probe forming aperture with convergence angle larger than about 50 mrad—allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 {\AA}.",

keywords = "Ptychography, Differential phase contrast, Scanning transmission electron microscopy",

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year = "2019",

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doi = "10.1016/j.ultramic.2018.12.010",

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Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy. / Brown, H G; Ishikawa, Ryo; Sánchez-Santolino, Gabriel; Shibata, Naoya; Ikuhara, Yuichi; Allen, L. J.; Findlay, S D.

In: Ultramicroscopy, Vol. 197, 01.02.2019, p. 112-121.

Research output: Contribution to journal › Article › Research › peer-review

TY - JOUR

T1 - Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

AU - Brown, H G

AU - Ishikawa, Ryo

AU - Sánchez-Santolino, Gabriel

AU - Shibata, Naoya

AU - Ikuhara, Yuichi

AU - Allen, L. J.

AU - Findlay, S D

PY - 2019/2/1

Y1 - 2019/2/1

N2 - Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of Ångströms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)—a probe forming aperture with convergence angle larger than about 50 mrad—allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 Å.

AB - Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of Ångströms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)—a probe forming aperture with convergence angle larger than about 50 mrad—allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 Å.

KW - Ptychography

KW - Differential phase contrast

KW - Scanning transmission electron microscopy

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U2 - 10.1016/j.ultramic.2018.12.010

DO - 10.1016/j.ultramic.2018.12.010

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SP - 112

EP - 121

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

ER -

Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

Abstract

Keywords

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Other files and links

Nanoscale field mapping in functional materials

Making every electron count in atomic resolution microscopy

Cite this

Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

Abstract

Keywords

Access to Document

Other files and links

Projects

Nanoscale field mapping in functional materials

Making every electron count in atomic resolution microscopy

Cite this