Abstract
Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of Ångströms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)—a probe forming aperture with convergence angle larger than about 50 mrad—allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 Å.
| Original language | English |
|---|---|
| Pages (from-to) | 112-121 |
| Number of pages | 10 |
| Journal | Ultramicroscopy |
| Volume | 197 |
| DOIs | |
| Publication status | Published - 1 Feb 2019 |
Keywords
- Ptychography
- Differential phase contrast
- Scanning transmission electron microscopy
Cite this
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Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy. / Brown, H G; Ishikawa, Ryo; Sánchez-Santolino, Gabriel; Shibata, Naoya; Ikuhara, Yuichi; Allen, L. J.; Findlay, S D.
In: Ultramicroscopy, Vol. 197, 01.02.2019, p. 112-121.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy
AU - Brown, H G
AU - Ishikawa, Ryo
AU - Sánchez-Santolino, Gabriel
AU - Shibata, Naoya
AU - Ikuhara, Yuichi
AU - Allen, L. J.
AU - Findlay, S D
PY - 2019/2/1
Y1 - 2019/2/1
N2 - Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of Ångströms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)—a probe forming aperture with convergence angle larger than about 50 mrad—allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 Å.
AB - Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of Ångströms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)—a probe forming aperture with convergence angle larger than about 50 mrad—allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 Å.
KW - Ptychography
KW - Differential phase contrast
KW - Scanning transmission electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=85059003727&partnerID=8YFLogxK
U2 - 10.1016/j.ultramic.2018.12.010
DO - 10.1016/j.ultramic.2018.12.010
M3 - Article
VL - 197
SP - 112
EP - 121
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
ER -