Laplacian image contrast in mirror electron microscopy

Shane Kennedy, Changxi Zheng, Wen-Xin Tang, David Paganin, David Jesson

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    We discuss an intuitive approach to interpreting mirror electron microscopy (MEM) images, whereby image contrast is primarily caused by the Laplacian of small height or potential variations across a sample surface. This variation is blurred slightly to account for the interaction of the electrons with the electrical potential away from the surface. The method is derived from the established geometrical theory of MEM contrast, and whilst it loses quantitative accuracy outside its domain of validity, it retains a simplicity that enables rapid interpretation of MEM images. A strong parallel exists between this method and out of focus contrast in transmission electron microscopy (TEM), which allows a number of extensions to be made, such as including the effects of spherical and chromatic aberration. A? 2010 The Royal Society.
    Original languageEnglish
    Pages (from-to)2857 - 2874
    Number of pages18
    JournalProceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences
    Issue number2122
    Publication statusPublished - 2010

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