Laboratory-based x-ray micro-tomography with submicron resolution

S. Mayo, P. Miller, S. W. Wilkins, B. Gao, T. Gureyev

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

3 Citations (Scopus)

Abstract

X-ray Microtomography bridges the 3D analysis gap between conventional x-ray tomography and TEM tomography. The use of a laboratory-based microfocus source opens up the opportunity to gain additional benefits from in-line phase contrast for enhancing the visibility of fine features, cracks, voids and boundaries in individual views. Coupled with phase retrieval methods, such images can be used as input to conventional reconstruction algorithms for three dimensional visualization. Working at high resolution brings challenges of physical stability of the system. Software approaches to overcoming these difficulties have enabled submicron resolution 3D reconstructions.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography V
DOIs
Publication statusPublished - 13 Nov 2006
Externally publishedYes
EventDevelopments in X-ray Tomography 2006 - San Diego, United States of America
Duration: 15 Aug 200617 Aug 2006
Conference number: 5th
https://spie.org/Publications/Proceedings/Volume/6318

Publication series

NameProgress in Biomedical Optics and Imaging - Proceedings of SPIE
Volume6318
ISSN (Print)1605-7422

Conference

ConferenceDevelopments in X-ray Tomography 2006
CountryUnited States of America
CitySan Diego
Period15/08/0617/08/06
Internet address

Keywords

  • Micro-tomography
  • Phase-contrast
  • X-ray microscopy

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