Kernel conditional quantile estimation via reduction revisited

Novi Quadrianto, Kristian Kersting, Mark D Reid, Tiberio S Caetano, Wray Lindsay Buntine

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Original languageEnglish
Title of host publicationProceedings - IEEE International Conference on Data Mining, ICDM
EditorsWei Wang, Hillol Kargupta, Sanjay Ranka, Philip S Yu, Xindong Wu
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages938 - 943
Number of pages6
ISBN (Print)9780769538952
DOIs
Publication statusPublished - 2009
Externally publishedYes
EventIEEE International Conference on Data Mining 2009 - Miami FL USA, Piscataway NJ USA
Duration: 1 Jan 2009 → …

Conference

ConferenceIEEE International Conference on Data Mining 2009
CityPiscataway NJ USA
Period1/01/09 → …

Cite this

Quadrianto, N., Kersting, K., Reid, M. D., Caetano, T. S., & Buntine, W. L. (2009). Kernel conditional quantile estimation via reduction revisited. In W. Wang, H. Kargupta, S. Ranka, P. S. Yu, & X. Wu (Eds.), Proceedings - IEEE International Conference on Data Mining, ICDM (pp. 938 - 943). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICDM.2009.82
Quadrianto, Novi ; Kersting, Kristian ; Reid, Mark D ; Caetano, Tiberio S ; Buntine, Wray Lindsay. / Kernel conditional quantile estimation via reduction revisited. Proceedings - IEEE International Conference on Data Mining, ICDM. editor / Wei Wang ; Hillol Kargupta ; Sanjay Ranka ; Philip S Yu ; Xindong Wu. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2009. pp. 938 - 943
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title = "Kernel conditional quantile estimation via reduction revisited",
author = "Novi Quadrianto and Kristian Kersting and Reid, {Mark D} and Caetano, {Tiberio S} and Buntine, {Wray Lindsay}",
year = "2009",
doi = "10.1109/ICDM.2009.82",
language = "English",
isbn = "9780769538952",
pages = "938 -- 943",
editor = "Wei Wang and Hillol Kargupta and Sanjay Ranka and Yu, {Philip S} and Xindong Wu",
booktitle = "Proceedings - IEEE International Conference on Data Mining, ICDM",
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Quadrianto, N, Kersting, K, Reid, MD, Caetano, TS & Buntine, WL 2009, Kernel conditional quantile estimation via reduction revisited. in W Wang, H Kargupta, S Ranka, PS Yu & X Wu (eds), Proceedings - IEEE International Conference on Data Mining, ICDM. IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. 938 - 943, IEEE International Conference on Data Mining 2009, Piscataway NJ USA, 1/01/09. https://doi.org/10.1109/ICDM.2009.82

Kernel conditional quantile estimation via reduction revisited. / Quadrianto, Novi; Kersting, Kristian; Reid, Mark D; Caetano, Tiberio S; Buntine, Wray Lindsay.

Proceedings - IEEE International Conference on Data Mining, ICDM. ed. / Wei Wang; Hillol Kargupta; Sanjay Ranka; Philip S Yu; Xindong Wu. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2009. p. 938 - 943.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

TY - GEN

T1 - Kernel conditional quantile estimation via reduction revisited

AU - Quadrianto, Novi

AU - Kersting, Kristian

AU - Reid, Mark D

AU - Caetano, Tiberio S

AU - Buntine, Wray Lindsay

PY - 2009

Y1 - 2009

UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5360337

U2 - 10.1109/ICDM.2009.82

DO - 10.1109/ICDM.2009.82

M3 - Conference Paper

SN - 9780769538952

SP - 938

EP - 943

BT - Proceedings - IEEE International Conference on Data Mining, ICDM

A2 - Wang, Wei

A2 - Kargupta, Hillol

A2 - Ranka, Sanjay

A2 - Yu, Philip S

A2 - Wu, Xindong

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway NJ USA

ER -

Quadrianto N, Kersting K, Reid MD, Caetano TS, Buntine WL. Kernel conditional quantile estimation via reduction revisited. In Wang W, Kargupta H, Ranka S, Yu PS, Wu X, editors, Proceedings - IEEE International Conference on Data Mining, ICDM. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. 2009. p. 938 - 943 https://doi.org/10.1109/ICDM.2009.82