Kelvin probe microscopy and electronic transport in graphene on SiC(0001) in the minimum conductivity regime

A E Curtin, Michael Fuhrer, J L Tedesco, R L Meyers-Ward, C R Eddy Jr., D K Gaskill

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@article{2fca9159e53347dd946c8b22c2f18525,

title = "Kelvin probe microscopy and electronic transport in graphene on SiC(0001) in the minimum conductivity regime",

author = "Curtin, {A E} and Michael Fuhrer and Tedesco, {J L} and Meyers-Ward, {R L} and {Eddy Jr.}, {C R} and Gaskill, {D K}",

year = "2011",

doi = "10.1063/1.3595360",

language = "English",

volume = "98",

pages = "1 -- 3",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "24",

}

TY - JOUR

T1 - Kelvin probe microscopy and electronic transport in graphene on SiC(0001) in the minimum conductivity regime

AU - Curtin, A E

AU - Fuhrer, Michael

AU - Tedesco, J L

AU - Meyers-Ward, R L

AU - Eddy Jr., C R

AU - Gaskill, D K

PY - 2011

Y1 - 2011

U2 - 10.1063/1.3595360

DO - 10.1063/1.3595360

M3 - Article

SN - 0003-6951

VL - 98

SP - 1

EP - 3

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

ER -