Intrasession test-retest variability of microperimetry in age-related macular degeneration

Zhichao Wu, Lauren N Ayton, Robyn H. Guymer, Chi D Luu

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99 Citations (Scopus)


Purpose. To determine the intrasession test-retest variability of microperimetry in participants with age-related macular degeneration (AMD). Methods. This study consisted of two separate groups of subjects who had not performed microperimetry previously. In group 1, 30 AMD and 14 control participants performed three microperimetry examinations of a selected eye within one session (test 1 and 2, first pair; test 2 and 3, second pair). Follow-up examination at 6 months was available in 20 AMD participants in group 1, who performed two microperimetry examinations. In group 2, 71 AMD participants performed a short practice examination, then two microperimetry examinations of the right eye (test 1 and 2, first pair) and two of the left eye (test 3 and 4, second pair). Results. There was a significant improvement in average point-wise sensitivity (PWS) between the first pair of examination in both groups (P < 0.001), but not in the subsequent pair (P ≥ 0.774). This improvement was not observed at the follow-up visit in the subset of AMD participants in group 1 (P = 0.433). The PWS coefficient of repeatability (CoR) for the second pair of examinations was ±4.12 dB and ±4.37 dB for AMD participants for group 1 and 2 respectively. Conclusions. A significant increase in sensitivity between the first and second test, but not in the subsequent tests, was found for participants who had not performed microperimetry previously. Intrasession test-retest variability can therefore be minimized by discarding the first examination to avoid the influence of a learning effect.

Original languageEnglish
Pages (from-to)7378-7385
Number of pages8
JournalInvestigative Ophthalmology and Visual Science
Issue number12
Publication statusPublished - 17 Oct 2013
Externally publishedYes


  • Age-related macular degeneration
  • Microperimetry
  • Repeatability
  • Test-retest
  • Variability

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