Projects per year
Abstract
Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis
Original language | English |
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Pages (from-to) | 1-7 |
Number of pages | 7 |
Journal | Ultramicroscopy |
Volume | 171 |
DOIs | |
Publication status | Published - Dec 2016 |
Keywords
- Scanning transmission electron microscopy (STEM)
- Atomic resolution
- Energy-dispersive X-ray spectroscopy
- Electron channeling
- Probe convergence angle
Projects
- 1 Finished
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Making every electron count in atomic resolution microscopy
Findlay, S. (Primary Chief Investigator (PCI)), Allen, L. (Chief Investigator (CI)), D'Alfonso, A. (Chief Investigator (CI)) & Weyland, M. (Chief Investigator (CI))
ARC - Australian Research Council, Monash University
2/01/14 → 1/06/18
Project: Research
Equipment
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Monash Centre for Electron Microscopy (MCEM)
Sorrell, F. (Manager) & Miller, P. (Manager)
Office of the Vice-Provost (Research and Research Infrastructure)Facility/equipment: Facility