Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy

J H Dycus; W Xu; X Sang; A J D'Alfonso; Z Chen; M Weyland; L J Allen; S D Findlay; J M LeBeau

doi:10.1016/j.ultramic.2016.08.013

Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy

J H Dycus, W Xu, X Sang, A J D'Alfonso, Z Chen, M Weyland, L J Allen, S D Findlay, J M LeBeau

Research output: Contribution to journal › Article › Research › peer-review

6 Citations (Scopus)

Abstract

Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis

Original language	English
Pages (from-to)	1-7
Number of pages	7
Journal	Ultramicroscopy
Volume	171
DOIs	https://doi.org/10.1016/j.ultramic.2016.08.013
Publication status	Published - Dec 2016

Keywords

Scanning transmission electron microscopy (STEM)
Atomic resolution
Energy-dispersive X-ray spectroscopy
Electron channeling
Probe convergence angle

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10.1016/j.ultramic.2016.08.013

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title = "Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy",

abstract = "Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis",

keywords = "Scanning transmission electron microscopy (STEM), Atomic resolution, Energy-dispersive X-ray spectroscopy, Electron channeling, Probe convergence angle",

author = "Dycus, {J H} and W Xu and X Sang and D'Alfonso, {A J} and Z Chen and M Weyland and Allen, {L J} and Findlay, {S D} and LeBeau, {J M}",

year = "2016",

month = dec,

doi = "10.1016/j.ultramic.2016.08.013",

language = "English",

volume = "171",

pages = "1--7",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier BV",

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TY - JOUR

T1 - Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy

AU - Dycus, J H

AU - Xu, W

AU - Sang, X

AU - D'Alfonso, A J

AU - Chen, Z

AU - Weyland, M

AU - Allen, L J

AU - Findlay, S D

AU - LeBeau, J M

PY - 2016/12

Y1 - 2016/12

N2 - Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis

AB - Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis

KW - Scanning transmission electron microscopy (STEM)

KW - Atomic resolution

KW - Energy-dispersive X-ray spectroscopy

KW - Electron channeling

KW - Probe convergence angle

U2 - 10.1016/j.ultramic.2016.08.013

DO - 10.1016/j.ultramic.2016.08.013

M3 - Article

VL - 171

SP - 1

EP - 7

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

ER -

Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy

Abstract

Keywords

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