Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 1-7 |
| Number of pages | 7 |
| Journal | Ultramicroscopy |
| Volume | 171 |
| DOIs | |
| Publication status | Published - Dec 2016 |
Keywords
- Scanning transmission electron microscopy (STEM)
- Atomic resolution
- Energy-dispersive X-ray spectroscopy
- Electron channeling
- Probe convergence angle
Cite this
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Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy. / Dycus, J H; Xu, W; Sang, X; D'Alfonso, A J; Chen, Z; Weyland, M; Allen, L J; Findlay, S D; LeBeau, J M.
In: Ultramicroscopy, Vol. 171, 12.2016, p. 1-7.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy
AU - Dycus, J H
AU - Xu, W
AU - Sang, X
AU - D'Alfonso, A J
AU - Chen, Z
AU - Weyland, M
AU - Allen, L J
AU - Findlay, S D
AU - LeBeau, J M
PY - 2016/12
Y1 - 2016/12
N2 - Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis
AB - Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis
KW - Scanning transmission electron microscopy (STEM)
KW - Atomic resolution
KW - Energy-dispersive X-ray spectroscopy
KW - Electron channeling
KW - Probe convergence angle
UR - http://www.sciencedirect.com/science/article/pii/S0304399116301462
U2 - 10.1016/j.ultramic.2016.08.013
DO - 10.1016/j.ultramic.2016.08.013
M3 - Article
VL - 171
SP - 1
EP - 7
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
ER -