Skip to main navigation Skip to search Skip to main content

Indirect excitons in hydrogen-doped ZnO

  • Liangchen Zhu
  • , Laurent L.C. Lem
  • , Thien-Phap Nguyen
  • , Kit Fair
  • , Sajid Ali
  • , Michael J. Ford
  • , Matthew R. Phillips
  • , Cuong Ton-That

Research output: Contribution to journalArticleResearchpeer-review

Abstract

We present a correlative experimental and theoretical study of bound excitons in hydrogen-doped ZnO, with a particular focus on the dynamics of their metastable state confined in the sub-surface region, using a combination of surface-sensitive characterisation techniques and density functional theory calculations. A metastable sub-surface emission at 3.31 eV found in H-doped ZnO is attributed to the radiative recombination of indirect excitons localised at basal plane stacking faults (BSFs) where the excitonic transition involves electrons bound to bond-centre hydrogen donors in the potential well of the BSF. Additionally, our work shows the electrical transport of ZnO Schottky junctions is dominated by electrons confined at BSFs in the near-surface region.

Original languageEnglish
Article number115104
Number of pages6
JournalJournal of Physics D: Applied Physics
Volume50
Issue number11
DOIs
Publication statusPublished - 17 Feb 2017
Externally publishedYes

Keywords

  • cathodoluminescence
  • hydrogen
  • indirect excitons
  • stacking fault
  • ZnO

Cite this