In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale

Andrei Yurievich Nikulin, Aliaksandr Darahanau, Rouben Dilanian, Barrington Charles Muddle, A Yu Souvorov, Osami Sakata

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Original languageEnglish
    Title of host publicationDevelopement in X-ray Tomography VI
    EditorsStuart R Stock
    Place of PublicationUSA
    PublisherSPIE
    Pages70781M-1 - 70781M-12
    Number of pages12
    Volume7078
    Publication statusPublished - 2008
    EventDevelopments in X-ray Tomography 2008 - San Diego, United States of America
    Duration: 12 Aug 200814 Aug 2008
    Conference number: 6th
    https://spie.org/Publications/Proceedings/Volume/7078?SSO=1

    Conference

    ConferenceDevelopments in X-ray Tomography 2008
    CountryUnited States of America
    CitySan Diego
    Period12/08/0814/08/08
    Internet address

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