In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale

Andrei Yurievich Nikulin; Aliaksandr Darahanau; Rouben Dilanian; Barrington Charles Muddle; A Yu Souvorov; Osami Sakata

In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale

Andrei Yurievich Nikulin, Aliaksandr Darahanau, Rouben Dilanian, Barrington Charles Muddle, A Yu Souvorov, Osami Sakata

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Developement in X-ray Tomography VI
Editors	Stuart R Stock
Place of Publication	USA
Publisher	SPIE
Pages	70781M-1 - 70781M-12
Number of pages	12
Volume	7078
Publication status	Published - 2008
Event	Developments in X-ray Tomography 2008 - San Diego, United States of America Duration: 12 Aug 2008 → 14 Aug 2008 Conference number: 6th https://spie.org/Publications/Proceedings/Volume/7078?SSO=1

Conference

Conference	Developments in X-ray Tomography 2008
Country/Territory	United States of America
City	San Diego
Period	12/08/08 → 14/08/08
Internet address	https://spie.org/Publications/Proceedings/Volume/7078?SSO=1

Cite this

@inproceedings{33d56963520746cf98a9a0937c8b802a,

title = "In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale",

author = "Nikulin, {Andrei Yurievich} and Aliaksandr Darahanau and Rouben Dilanian and Muddle, {Barrington Charles} and Souvorov, {A Yu} and Osami Sakata",

year = "2008",

language = "English",

volume = "7078",

pages = "70781M--1 -- 70781M--12",

editor = "Stock, {Stuart R}",

booktitle = "Developement in X-ray Tomography VI",

publisher = "SPIE",

address = "United States of America",

note = "Developments in X-ray Tomography 2008 ; Conference date: 12-08-2008 Through 14-08-2008",

url = "https://spie.org/Publications/Proceedings/Volume/7078?SSO=1",

}

Nikulin, AY, Darahanau, A, Dilanian, R, Muddle, BC, Souvorov, AY & Sakata, O 2008, In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale. in SR Stock (ed.), Developement in X-ray Tomography VI. vol. 7078, SPIE, USA, pp. 70781M-1 - 70781M-12, Developments in X-ray Tomography 2008, San Diego, California, United States of America, 12/08/08.

In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale. / Nikulin, Andrei Yurievich; Darahanau, Aliaksandr; Dilanian, Rouben et al.
Developement in X-ray Tomography VI. ed. / Stuart R Stock. Vol. 7078 USA: SPIE, 2008. p. 70781M-1 - 70781M-12.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale

AU - Nikulin, Andrei Yurievich

AU - Darahanau, Aliaksandr

AU - Dilanian, Rouben

AU - Muddle, Barrington Charles

AU - Souvorov, A Yu

AU - Sakata, Osami

N1 - Conference code: 6th

PY - 2008

Y1 - 2008

M3 - Conference Paper

VL - 7078

SP - 70781M-1 - 70781M-12

BT - Developement in X-ray Tomography VI

A2 - Stock, Stuart R

PB - SPIE

CY - USA

T2 - Developments in X-ray Tomography 2008

Y2 - 12 August 2008 through 14 August 2008

ER -