Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation

Yuanyuan He; Chang-Jun Yu; Tai-Fan Quan; Xin Jin

doi:10.1109/INDIN.2008.4618373

Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation

Yuanyuan He, Chang-Jun Yu, Tai-Fan Quan, Xin Jin

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings: IEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics
Editors	Ju-Jang Lee, Xinghuo Yu
Place of Publication	Piscataway NJ USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	1678 - 1683
Number of pages	6
ISBN (Print)	9781424421718
DOIs	https://doi.org/10.1109/INDIN.2008.4618373
Publication status	Published - 2008
Externally published	Yes
Event	IEEE International Conference on Industrial Informatics 2008 - Daejeon South Korea, Piscataway NJ USA Duration: 1 Jan 2008 → …

Conference

Conference	IEEE International Conference on Industrial Informatics 2008
City	Piscataway NJ USA
Period	1/01/08 → …

Access to Document

10.1109/INDIN.2008.4618373

RM sElocation

Cite this

He, Y., Yu, C-J., Quan, T-F., & Jin, X. (2008). Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation. In J-J. Lee, & X. Yu (Eds.), Proceedings: IEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics (pp. 1678 - 1683). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/INDIN.2008.4618373

He, Yuanyuan ; Yu, Chang-Jun ; Quan, Tai-Fan ; Jin, Xin. / Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation. Proceedings: IEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics. editor / Ju-Jang Lee ; Xinghuo Yu. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2008. pp. 1678 - 1683

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title = "Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation",

author = "Yuanyuan He and Chang-Jun Yu and Tai-Fan Quan and Xin Jin",

year = "2008",

doi = "10.1109/INDIN.2008.4618373",

language = "English",

isbn = "9781424421718",

pages = "1678 -- 1683",

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booktitle = "Proceedings: IEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

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note = "IEEE International Conference on Industrial Informatics 2008 ; Conference date: 01-01-2008",

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He, Y, Yu, C-J, Quan, T-F & Jin, X 2008, Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation. in J-J Lee & X Yu (eds), Proceedings: IEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics. IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. 1678 - 1683, IEEE International Conference on Industrial Informatics 2008, Piscataway NJ USA, 1/01/08. https://doi.org/10.1109/INDIN.2008.4618373

Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation. / He, Yuanyuan; Yu, Chang-Jun; Quan, Tai-Fan; Jin, Xin.

Proceedings: IEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics. ed. / Ju-Jang Lee; Xinghuo Yu. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2008. p. 1678 - 1683.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

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T1 - Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation

AU - He, Yuanyuan

AU - Yu, Chang-Jun

AU - Quan, Tai-Fan

AU - Jin, Xin

PY - 2008

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BT - Proceedings: IEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics

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T2 - IEEE International Conference on Industrial Informatics 2008

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He Y, Yu C-J, Quan T-F, Jin X. Impulsive interference detection method based on morlet wavelet and maximum likelihood estimation. In Lee J-J, Yu X, editors, Proceedings: IEEE INDIN 2008: 6th IEEE International Conference on Industrial Informatics. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. 2008. p. 1678 - 1683 https://doi.org/10.1109/INDIN.2008.4618373