Improving image classification using extended run length features

Syed M Rahman, Gour Karmakar, Robert J Bignall

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    4 Citations (Scopus)

    Abstract

    In this paper we evaluate the performance of self-organising maps (SOM) for image classification using invariant features based on run length alone and also on run length plus run length totals, for horizontal runs. Objects were manually separated from an experimental set of natural images. Object classification performance was evaluated by comparing the SOM classifications independently with a manual classification for both of the feature extraction methods. The experimental results showed that image classification using the run length method that included run length totals achieved a recognition rate that was, on average, 4.65 percentage points higher that the recognition rate achieved with the normal run length method. Thus the extended method is promising for practical applications.
    Original languageEnglish
    Title of host publicationVisual Information and Information Systems
    Subtitle of host publicationThird International Conference, VISUAL’99 Amsterdam, The Netherlands, June 2-4, 1999 Proceedings
    EditorsDionysius P. Huijsmans, Arnold W.M. Smeulders
    Place of PublicationBerlin Germany
    PublisherSpringer
    Pages475-482
    Number of pages8
    ISBN (Print)3540660798
    DOIs
    Publication statusPublished - 1999
    Event3rd International Conference on Visual Information Systems, VISUAL 1999 - Amsterdam, Netherlands
    Duration: 2 Jun 19994 Jun 1999

    Publication series

    NameLecture Notes in Computer Science
    PublisherSpringer
    ISSN (Print)0302-9743

    Conference

    Conference3rd International Conference on Visual Information Systems, VISUAL 1999
    CountryNetherlands
    City Amsterdam
    Period2/06/994/06/99

    Cite this

    Rahman, S. M., Karmakar, G., & Bignall, R. J. (1999). Improving image classification using extended run length features. In D. P. Huijsmans, & A. W. M. Smeulders (Eds.), Visual Information and Information Systems: Third International Conference, VISUAL’99 Amsterdam, The Netherlands, June 2-4, 1999 Proceedings (pp. 475-482). (Lecture Notes in Computer Science). Springer. https://doi.org/10.1007/3-540-48762-X_59