Improving efficiency of IC burn-in testing

Yong Han Ng; Yew Hock Low; Serge Demidenko

Improving efficiency of IC burn-in testing

Yong Han Ng, Yew Hock Low, Serge Demidenko

Malaysia School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings
Editors	E Petriu, A El Saddik, F Ponci, K Fowler
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	1685 - 1689
Number of pages	5
ISBN (Print)	1-4244-1541-1
Publication status	Published - 2008
Event	IEEE International Instrumentation and Measurement Technology Conference 2008 - Fairmont Express Hotel & Victoria Conference Center, Victoria, Canada Duration: 12 May 2008 → 15 May 2008 Conference number: 25th https://ieeexplore.ieee.org/xpl/conhome/4539706/proceeding (IEEE Conference Proceedings)

Conference

Conference	IEEE International Instrumentation and Measurement Technology Conference 2008
Abbreviated title	I2MTC 2008
Country/Territory	Canada
City	Victoria
Period	12/05/08 → 15/05/08
Internet address	https://ieeexplore.ieee.org/xpl/conhome/4539706/proceeding (IEEE Conference Proceedings)

Cite this

@inproceedings{b85983e161374451bde35973e0621e21,

title = "Improving efficiency of IC burn-in testing",

author = "Ng, \{Yong Han\} and Low, \{Yew Hock\} and Serge Demidenko",

year = "2008",

language = "English",

isbn = "1-4244-1541-1",

pages = "1685 -- 1689",

editor = "E Petriu and \{El Saddik\}, A and F Ponci and K Fowler",

booktitle = "2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE International Instrumentation and Measurement Technology Conference 2008, I2MTC 2008 ; Conference date: 12-05-2008 Through 15-05-2008",

url = "https://ieeexplore.ieee.org/xpl/conhome/4539706/proceeding",

}

Ng, YH, Low, YH & Demidenko, S 2008, Improving efficiency of IC burn-in testing. in E Petriu, A El Saddik, F Ponci & K Fowler (eds), 2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings. IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 1685 - 1689, IEEE International Instrumentation and Measurement Technology Conference 2008, Victoria, British Columbia, Canada, 12/05/08.

Improving efficiency of IC burn-in testing. / Ng, Yong Han; Low, Yew Hock; Demidenko, Serge.
2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings. ed. / E Petriu; A El Saddik; F Ponci; K Fowler. USA: IEEE, Institute of Electrical and Electronics Engineers, 2008. p. 1685 - 1689.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Improving efficiency of IC burn-in testing

AU - Ng, Yong Han

AU - Low, Yew Hock

AU - Demidenko, Serge

N1 - Conference code: 25th

PY - 2008

Y1 - 2008

M3 - Conference Paper

SN - 1-4244-1541-1

SP - 1685

EP - 1689

BT - 2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings

A2 - Petriu, E

A2 - El Saddik, A

A2 - Ponci, F

A2 - Fowler, K

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - IEEE International Instrumentation and Measurement Technology Conference 2008

Y2 - 12 May 2008 through 15 May 2008

ER -