Improving efficiency of IC burn-in testing

Yong Han Ng, Yew Hock Low, Serge Demidenko

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    10 Citations (Scopus)
    Original languageEnglish
    Title of host publication2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings
    EditorsE Petriu, A El Saddik, F Ponci, K Fowler
    Place of PublicationUSA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages1685 - 1689
    Number of pages5
    ISBN (Print)1-4244-1541-1
    Publication statusPublished - 2008
    EventIEEE International Instrumentation and Measurement Technology Conference 2008 - Fairmont Express Hotel & Victoria Conference Center, Victoria, Canada
    Duration: 12 May 200815 May 2008
    https://ieeexplore.ieee.org/xpl/conhome/4539706/proceeding (IEEE Conference Proceedings)

    Conference

    ConferenceIEEE International Instrumentation and Measurement Technology Conference 2008
    Abbreviated titleI2MTC 2008
    CountryCanada
    CityVictoria
    Period12/05/0815/05/08
    Internet address

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