Impact characterization of multiple-points-defect on machine fault diagnosis

Muhammad Farrukh Yaqub; Iqbal Gondal; Joarder Kamruzzaman

Impact characterization of multiple-points-defect on machine fault diagnosis

Muhammad Farrukh Yaqub, Iqbal Gondal, Joarder Kamruzzaman

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	2012 IEEE International Conference on Automation Science and Engineering (CASE)
Editors	Michael Yu Wang
Place of Publication	Piscataway NJ USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	475 - 480
Number of pages	6
ISBN (Print)	9781467304283
Publication status	Published - 2012
Event	IEEE Conference on Automation Science and Engineering 2012 - Grand Hyatt Seoul Hotel, Seoul, Korea, South Duration: 20 Aug 2012 → 24 Aug 2012 Conference number: 8th https://ieeexplore.ieee.org/xpl/conhome/6375512/proceeding (Proceedings)

Conference

Conference	IEEE Conference on Automation Science and Engineering 2012
Abbreviated title	CASE 2012
Country/Territory	Korea, South
City	Seoul
Period	20/08/12 → 24/08/12
Internet address	https://ieeexplore.ieee.org/xpl/conhome/6375512/proceeding (Proceedings)

Cite this

@inproceedings{4c236615790e450aa7808fd98dd0b2e3,

title = "Impact characterization of multiple-points-defect on machine fault diagnosis",

author = "Yaqub, \{Muhammad Farrukh\} and Iqbal Gondal and Joarder Kamruzzaman",

year = "2012",

language = "English",

isbn = "9781467304283",

pages = "475 -- 480",

editor = "Wang, \{Michael Yu\}",

booktitle = "2012 IEEE International Conference on Automation Science and Engineering (CASE)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE Conference on Automation Science and Engineering 2012, CASE 2012 ; Conference date: 20-08-2012 Through 24-08-2012",

url = "https://ieeexplore.ieee.org/xpl/conhome/6375512/proceeding",

}

Yaqub, MF, Gondal, I & Kamruzzaman, J 2012, Impact characterization of multiple-points-defect on machine fault diagnosis. in MY Wang (ed.), 2012 IEEE International Conference on Automation Science and Engineering (CASE). IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. 475 - 480, IEEE Conference on Automation Science and Engineering 2012, Seoul, Korea, South, 20/08/12.

Impact characterization of multiple-points-defect on machine fault diagnosis. / Yaqub, Muhammad Farrukh; Gondal, Iqbal; Kamruzzaman, Joarder.
2012 IEEE International Conference on Automation Science and Engineering (CASE). ed. / Michael Yu Wang. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, 2012. p. 475 - 480.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Impact characterization of multiple-points-defect on machine fault diagnosis

AU - Yaqub, Muhammad Farrukh

AU - Gondal, Iqbal

AU - Kamruzzaman, Joarder

N1 - Conference code: 8th

PY - 2012

Y1 - 2012

UR - https://www.scopus.com/pages/publications/84872588322

M3 - Conference Paper

SN - 9781467304283

SP - 475

EP - 480

BT - 2012 IEEE International Conference on Automation Science and Engineering (CASE)

A2 - Wang, Michael Yu

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway NJ USA

T2 - IEEE Conference on Automation Science and Engineering 2012

Y2 - 20 August 2012 through 24 August 2012

ER -

Impact characterization of multiple-points-defect on machine fault diagnosis

Conference

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