Impact characterization of multiple-points-defect on machine fault diagnosis

Muhammad Farrukh Yaqub, Iqbal Gondal, Joarder Kamruzzaman

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publication2012 IEEE International Conference on Automation Science and Engineering (CASE)
    EditorsMichael Yu Wang
    Place of PublicationPiscataway NJ USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages475 - 480
    Number of pages6
    ISBN (Print)9781467304283
    Publication statusPublished - 2012
    EventIEEE Conference on Automation Science and Engineering 2012 - Grand Hyatt Seoul Hotel, Seoul, Korea, Republic of (South)
    Duration: 20 Aug 201224 Aug 2012
    Conference number: 8th
    https://ieeexplore.ieee.org/xpl/conhome/6375512/proceeding (Proceedings)

    Conference

    ConferenceIEEE Conference on Automation Science and Engineering 2012
    Abbreviated titleCASE 2012
    CountryKorea, Republic of (South)
    CitySeoul
    Period20/08/1224/08/12
    Internet address

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