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Imaging of gaAs nanowire using combined aberration-corrected tem/stem and exit wave restoration

Lan-Yun Chang, Robert L Price (Editor), Sorin Lazar, B Bartova, Gianluigi A Botton, C Hebert, A Fontcuberta i Morral

Research output: Contribution to conferenceAbstract

Original languageEnglish
Pages138 - 139
Number of pages2
Publication statusPublished - 2009
EventMicroscopy and Microanalysis 2009 - Richmond, United States of America
Duration: 26 Jul 200930 Jul 2009

Conference

ConferenceMicroscopy and Microanalysis 2009
Country/TerritoryUnited States of America
CityRichmond
Period26/07/0930/07/09

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