Imaging of gaAs nanowire using combined aberration-corrected tem/stem and exit wave restoration

Lan-Yun Chang, Robert L Price (Editor), Sorin Lazar, B Bartova, Gianluigi A Botton, C Hebert, A Fontcuberta i Morral

Research output: Contribution to conferenceAbstract

1 Citation (Scopus)
Original languageEnglish
Pages138 - 139
Number of pages2
Publication statusPublished - 2009
EventMicroscopy and Microanalysis 2009 - Richmond, United States of America
Duration: 26 Jul 200930 Jul 2009

Conference

ConferenceMicroscopy and Microanalysis 2009
CountryUnited States of America
CityRichmond
Period26/07/0930/07/09

Cite this

Chang, L-Y., Price, R. L. (Ed.), Lazar, S., Bartova, B., Botton, G. A., Hebert, C., & Fontcuberta i Morral, A. (2009). Imaging of gaAs nanowire using combined aberration-corrected tem/stem and exit wave restoration. 138 - 139. Abstract from Microscopy and Microanalysis 2009, Richmond, United States of America.