Identifying systematic failures on semiconductor wafers using ADCAS

Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Joo Sim Eric Kwang, Serge N. Demidenko, Chris Chan

Research output: Contribution to journalArticleResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)44 - 53
Number of pages10
JournalIEEE Design & Test
Issue number5
Publication statusPublished - 2013

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