HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques

Ai Leen Koh, Ondřej Tomanec, Michal Urbánek, Tomáš Šikola, Stefan A. Maier, David W. McComb

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Abstract

This paper describes the use of focused ion beam (FIB) techniques to fabricate Au nanoantenna structures for plasmonics applications. High-resolution transmission electron microscopy (HRTEM), diffraction and electron energy-loss spectroscopy (EELS) techniques are applied to investigate the structures of the initially patterned film, fabricated nanoantenna structures, and to map localized surface plasmon resonance (LSPR) modes in the nanostructures.

Original languageEnglish
Article number012041
Number of pages4
JournalJournal of Physics: Conference Series
Volume241
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventInstitute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2009 - Sheffield, United Kingdom
Duration: 9 Sept 200911 Sept 2009
https://www.proceedings.com/08979.html

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