Abstract
This paper describes the use of focused ion beam (FIB) techniques to fabricate Au nanoantenna structures for plasmonics applications. High-resolution transmission electron microscopy (HRTEM), diffraction and electron energy-loss spectroscopy (EELS) techniques are applied to investigate the structures of the initially patterned film, fabricated nanoantenna structures, and to map localized surface plasmon resonance (LSPR) modes in the nanostructures.
Original language | English |
---|---|
Article number | 012041 |
Number of pages | 4 |
Journal | Journal of Physics: Conference Series |
Volume | 241 |
DOIs | |
Publication status | Published - 2010 |
Externally published | Yes |
Event | Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2009 - Sheffield, United Kingdom Duration: 9 Sept 2009 → 11 Sept 2009 https://www.proceedings.com/08979.html |