High tilt, automated, electron tomography of materials by incoherent (HAADF) and inelastic (EFTEM) scattering

M. Weyland; L. Laffont; P. A. Midgley

High tilt, automated, electron tomography of materials by incoherent (HAADF) and inelastic (EFTEM) scattering

M. Weyland, L. Laffont, P. A. Midgley

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

High angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) tomography and energy filtered transmission electron microscopy (EFTEM) tomography are promising techniques for the analysis of nanostructured materials. This paper describes the development of materials tomography methodology using modified holder designs and fully automated acquisition schemes. The details of the improvement achieved are demonstrated, potential pitfalls with EFTEM tomography examined and possible future directions discussed.

Original language	English
Pages (from-to)	349-352
Number of pages	4
Journal	Institute of Physics Conference Series
Volume	179
Publication status	Published - 19 Oct 2004
Externally published	Yes
Event	Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Oxford, United Kingdom Duration: 3 Sep 2003 → 5 Sep 2003

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Cite this

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title = "High tilt, automated, electron tomography of materials by incoherent (HAADF) and inelastic (EFTEM) scattering",

abstract = "High angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) tomography and energy filtered transmission electron microscopy (EFTEM) tomography are promising techniques for the analysis of nanostructured materials. This paper describes the development of materials tomography methodology using modified holder designs and fully automated acquisition schemes. The details of the improvement achieved are demonstrated, potential pitfalls with EFTEM tomography examined and possible future directions discussed.",

author = "M. Weyland and L. Laffont and Midgley, {P. A.}",

year = "2004",

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day = "19",

language = "English",

volume = "179",

pages = "349--352",

journal = "Institute of Physics Conference Series",

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note = "Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference ; Conference date: 03-09-2003 Through 05-09-2003",

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T1 - High tilt, automated, electron tomography of materials by incoherent (HAADF) and inelastic (EFTEM) scattering

AU - Weyland, M.

AU - Laffont, L.

AU - Midgley, P. A.

PY - 2004/10/19

Y1 - 2004/10/19

N2 - High angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) tomography and energy filtered transmission electron microscopy (EFTEM) tomography are promising techniques for the analysis of nanostructured materials. This paper describes the development of materials tomography methodology using modified holder designs and fully automated acquisition schemes. The details of the improvement achieved are demonstrated, potential pitfalls with EFTEM tomography examined and possible future directions discussed.

AB - High angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) tomography and energy filtered transmission electron microscopy (EFTEM) tomography are promising techniques for the analysis of nanostructured materials. This paper describes the development of materials tomography methodology using modified holder designs and fully automated acquisition schemes. The details of the improvement achieved are demonstrated, potential pitfalls with EFTEM tomography examined and possible future directions discussed.

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M3 - Conference article

AN - SCOPUS:5044221692

VL - 179

SP - 349

EP - 352

JO - Institute of Physics Conference Series

JF - Institute of Physics Conference Series

SN - 2154-6630

T2 - Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference

Y2 - 3 September 2003 through 5 September 2003

ER -