High-throughput X-ray fluorescence imaging using a massively parallel detector array, integrated scanning and real-time spectral deconvolution

Chris Ryan, David P Siddons, Gareth Moorhead, Robin Kirkham, Gianluigi De Geronimo, Barbara E Etschmann, Angelo Dragone, Paul A Dunn, Anthony J Kuczewski, Peter Davey, Michael L Jensen, James M Ablett, John Kuczewski, Robert Hough, David John Paterson

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    33 Citations (Scopus)

    Abstract

    A step improvement in X-ray fluorescence imaging performance is demonstrated through close integration of a large detector array, dedicated data acquisition, stage control and real-time parallel data processing, to achieve efficient elemental imaging with
    Original languageEnglish
    Title of host publication9th International Conference on X-Ray Microscopy
    PublisherIOP Publishing
    Number of pages3
    DOIs
    Publication statusPublished - 2009
    EventInternational Conference on X-ray Microscopy (XRM) 2008 - Zurich, Switzerland
    Duration: 21 Jul 200825 Jul 2008
    Conference number: 9th
    https://iopscience.iop.org/issue/1742-6596/186/1

    Publication series

    NameJournal of Physics: Conference Series
    PublisherIOP Publishing
    Volume186
    ISSN (Print)1742-6588

    Conference

    ConferenceInternational Conference on X-ray Microscopy (XRM) 2008
    Abbreviated titleXRM 2008
    Country/TerritorySwitzerland
    CityZurich
    Period21/07/0825/07/08
    OtherThe International Conference on X-Ray Microscopy (XRM2008) held on 20–25 July 2008 in Zurich, Switzerland. The conference was the ninth in a series which started in Göttingen in 1984. Over the years the XRM conference series has served as a forum bringing together all relevant players working on the development of methods, building instrumentation, and applying x-ray microscopy to challenging issues in materials science, condensed matter research, environmental science and biology.
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