Abstract
A step improvement in X-ray fluorescence imaging performance is demonstrated through close integration of a large detector array, dedicated data acquisition, stage control and real-time parallel data processing, to achieve efficient elemental imaging with
| Original language | English |
|---|---|
| Title of host publication | 9th International Conference on X-Ray Microscopy |
| Publisher | IOP Publishing |
| Number of pages | 3 |
| DOIs | |
| Publication status | Published - 2009 |
| Event | International Conference on X-ray Microscopy (XRM) 2008 - Zurich, Switzerland Duration: 21 Jul 2008 → 25 Jul 2008 Conference number: 9th https://iopscience.iop.org/issue/1742-6596/186/1 |
Publication series
| Name | Journal of Physics: Conference Series |
|---|---|
| Publisher | IOP Publishing |
| Volume | 186 |
| ISSN (Print) | 1742-6588 |
Conference
| Conference | International Conference on X-ray Microscopy (XRM) 2008 |
|---|---|
| Abbreviated title | XRM 2008 |
| Country/Territory | Switzerland |
| City | Zurich |
| Period | 21/07/08 → 25/07/08 |
| Other | The International Conference on X-Ray Microscopy (XRM2008) held on 20–25 July 2008 in Zurich, Switzerland. The conference was the ninth in a series which started in Göttingen in 1984. Over the years the XRM conference series has served as a forum bringing together all relevant players working on the development of methods, building instrumentation, and applying x-ray microscopy to challenging issues in materials science, condensed matter research, environmental science and biology. |
| Internet address |