High resolution X-ray microscopy in the scanning electron microscope

D. Redfern, L. A. Brownlow, C. J. Sheffield-Parker, P. R. Miller, S. C. Mayo

Research output: Contribution to journalMeeting Abstractpeer-review

Original languageEnglish
Pages (from-to)102-103
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 24 Sept 2004
Externally publishedYes

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