@article{6e6c143624ae401bbe51280f7d13b225,
title = "High-resolution TEM and the application of direct and indirect aberration correction",
author = "Hetherington, \{Crispin J D\} and Chang, \{Lan-Yun Shery\} and Sarah Haigh and Nellist, \{Peter D\} and Gontard, \{Lionel Cervera\} and Dunin-Borkowski, \{Rafal E\} and Kirkland, \{Angus I\}",
year = "2008",
doi = "10.1017/S1431927608080148",
language = "English",
volume = "14",
pages = "60 -- 67",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "1",
}