High-resolution TEM and the application of direct and indirect aberration correction

Crispin J D Hetherington; Lan-Yun Shery Chang; Sarah Haigh; Peter D Nellist; Lionel Cervera Gontard; Rafal E Dunin-Borkowski; Angus I Kirkland

doi:10.1017/S1431927608080148

High-resolution TEM and the application of direct and indirect aberration correction

Crispin J D Hetherington, Lan-Yun Shery Chang, Sarah Haigh, Peter D Nellist, Lionel Cervera Gontard, Rafal E Dunin-Borkowski, Angus I Kirkland

Research output: Contribution to journal › Article › Research › peer-review

16 Citations (Scopus)

Original language	English
Pages (from-to)	60 - 67
Number of pages	8
Journal	Microscopy and Microanalysis
Volume	14
Issue number	1
DOIs	https://doi.org/10.1017/S1431927608080148
Publication status	Published - 2008
Externally published	Yes

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title = "High-resolution TEM and the application of direct and indirect aberration correction",

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AU - Hetherington, Crispin J D

AU - Chang, Lan-Yun Shery

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AU - Gontard, Lionel Cervera

AU - Dunin-Borkowski, Rafal E

AU - Kirkland, Angus I

PY - 2008

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JF - Microscopy and Microanalysis

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High-resolution TEM and the application of direct and indirect aberration correction

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