High-resolution TEM and the application of direct and indirect aberration correction

Crispin J D Hetherington, Lan-Yun Shery Chang, Sarah Haigh, Peter D Nellist, Lionel Cervera Gontard, Rafal E Dunin-Borkowski, Angus I Kirkland

Research output: Contribution to journalArticleResearchpeer-review

16 Citations (Scopus)
Original languageEnglish
Pages (from-to)60 - 67
Number of pages8
JournalMicroscopy and Microanalysis
Issue number1
Publication statusPublished - 2008
Externally publishedYes

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