High-resolution radial distribution function of pure ion-implanted amorphous silicon measured using tilted-illumination selected-area electron diffraction

Alexander Robert Gorecki; Amelia Chi Ying Liu; Timothy Petersen

doi:10.1017/S1431927613013779

High-resolution radial distribution function of pure ion-implanted amorphous silicon measured using tilted-illumination selected-area electron diffraction

Alexander Robert Gorecki, Amelia Chi Ying Liu, Timothy Petersen

School of Physics and Astronomy

Research output: Contribution to journal › Article › Research › peer-review

6 Citations (Scopus)

Original language	English
Pages (from-to)	50 - 54
Number of pages	5
Journal	Microscopy and Microanalysis
Volume	20
Issue number	1
DOIs	https://doi.org/10.1017/S1431927613013779
Publication status	Published - 2014

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10.1017/S1431927613013779

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@article{781bc7c269b144df83c409640291235d,

title = "High-resolution radial distribution function of pure ion-implanted amorphous silicon measured using tilted-illumination selected-area electron diffraction",

author = "Gorecki, {Alexander Robert} and Liu, {Amelia Chi Ying} and Timothy Petersen",

year = "2014",

doi = "10.1017/S1431927613013779",

language = "English",

volume = "20",

pages = "50 -- 54",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "1",

}

High-resolution radial distribution function of pure ion-implanted amorphous silicon measured using tilted-illumination selected-area electron diffraction. / Gorecki, Alexander Robert; Liu, Amelia Chi Ying ; Petersen, Timothy.
In: Microscopy and Microanalysis, Vol. 20, No. 1, 2014, p. 50 - 54.

Research output: Contribution to journal › Article › Research › peer-review

TY - JOUR

T1 - High-resolution radial distribution function of pure ion-implanted amorphous silicon measured using tilted-illumination selected-area electron diffraction

AU - Gorecki, Alexander Robert

AU - Liu, Amelia Chi Ying

AU - Petersen, Timothy

PY - 2014

Y1 - 2014

U2 - 10.1017/S1431927613013779

DO - 10.1017/S1431927613013779

M3 - Article

SN - 1431-9276

VL - 20

SP - 50

EP - 54

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 1

ER -

High-resolution radial distribution function of pure ion-implanted amorphous silicon measured using tilted-illumination selected-area electron diffraction

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Centre for Electron Microscopy (MCEM)

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