High quality MEMS inductors for chipless RFID in harsh environment

Ali Mohammadi; Nemai Chandra Karmakar

doi:10.1109/AUSMS.2016.7593485

High quality MEMS inductors for chipless RFID in harsh environment

Ali Mohammadi, Nemai Chandra Karmakar

Electrical and Computer Systems Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other › peer-review

1 Citation (Scopus)

Abstract

Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

Original language	English
Title of host publication	AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings
Subtitle of host publication	11th - 12th February, 2016, Adelaide, Australia
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	43-44
Number of pages	2
ISBN (Electronic)	9781509004294
DOIs	https://doi.org/10.1109/AUSMS.2016.7593485
Publication status	Published - 18 Oct 2016
Event	Australian Microwave Symposium 2016 - Adelaide, Australia Duration: 11 Feb 2016 → 12 Feb 2016 Conference number: 2nd https://ieeexplore.ieee.org/xpl/conhome/7587669/proceeding (Proceedings)

Conference

Conference	Australian Microwave Symposium 2016
Abbreviated title	AMS 2016
Country/Territory	Australia
City	Adelaide
Period	11/02/16 → 12/02/16
Internet address	https://ieeexplore.ieee.org/xpl/conhome/7587669/proceeding (Proceedings)

Keywords

Chipless RFID tag
MEMS

Access to Document

10.1109/AUSMS.2016.7593485Licence: Unspecified

Cite this

@inproceedings{e793d249350e4460977bfdaaffe43ac0,

title = "High quality MEMS inductors for chipless RFID in harsh environment",

abstract = "Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.",

keywords = "Chipless RFID tag, MEMS",

author = "Ali Mohammadi and Karmakar, {Nemai Chandra}",

year = "2016",

month = oct,

day = "18",

doi = "10.1109/AUSMS.2016.7593485",

language = "English",

pages = "43--44",

booktitle = "AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "Australian Microwave Symposium 2016, AMS 2016 ; Conference date: 11-02-2016 Through 12-02-2016",

url = "https://ieeexplore.ieee.org/xpl/conhome/7587669/proceeding",

}

Mohammadi, A & Karmakar, NC 2016, High quality MEMS inductors for chipless RFID in harsh environment. in AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings: 11th - 12th February, 2016, Adelaide, Australia., 7593485, IEEE, Institute of Electrical and Electronics Engineers, pp. 43-44, Australian Microwave Symposium 2016, Adelaide, South Australia, Australia, 11/02/16. https://doi.org/10.1109/AUSMS.2016.7593485

High quality MEMS inductors for chipless RFID in harsh environment. / Mohammadi, Ali; Karmakar, Nemai Chandra.
AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings: 11th - 12th February, 2016, Adelaide, Australia. IEEE, Institute of Electrical and Electronics Engineers, 2016. p. 43-44 7593485.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other › peer-review

TY - GEN

T1 - High quality MEMS inductors for chipless RFID in harsh environment

AU - Mohammadi, Ali

AU - Karmakar, Nemai Chandra

N1 - Conference code: 2nd

PY - 2016/10/18

Y1 - 2016/10/18

N2 - Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

AB - Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

KW - Chipless RFID tag

KW - MEMS

UR - http://www.scopus.com/inward/record.url?scp=84995511400&partnerID=8YFLogxK

U2 - 10.1109/AUSMS.2016.7593485

DO - 10.1109/AUSMS.2016.7593485

M3 - Conference Paper

AN - SCOPUS:84995511400

SP - 43

EP - 44

BT - AMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings

PB - IEEE, Institute of Electrical and Electronics Engineers

T2 - Australian Microwave Symposium 2016

Y2 - 11 February 2016 through 12 February 2016

ER -

High quality MEMS inductors for chipless RFID in harsh environment

Abstract

Conference

Keywords

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