High quality MEMS inductors for chipless RFID in harsh environment

Ali Mohammadi, Nemai Chandra Karmakar

Research output: Chapter in Book/Report/Conference proceedingConference PaperOtherpeer-review

1 Citation (Scopus)


Quality factor of the conductive patches determine the read range and the number of uniquely encoded tags in chipless radio frequency identification (RFID) technologies. Radar cross section (RCS) of the conductive patches is typically used to evaluate the tag performance metrics including read range and number of bits. In this paper we have shown that the RCS can be significantly increased by using three dimensional microstructures instead of planar conductive patches. CST simulation results show a 20dB increase in RCS of 3-dimensional (3D) coils compared with planar coils.

Original languageEnglish
Title of host publicationAMS 2016 - 2016 2nd Australian Microwave Symposium, Conference Proceedings
Subtitle of host publication11th - 12th February, 2016, Adelaide, Australia
PublisherIEEE, Institute of Electrical and Electronics Engineers
Number of pages2
ISBN (Electronic)9781509004294
Publication statusPublished - 18 Oct 2016
EventAustralian Microwave Symposium 2016 - Adelaide, Australia
Duration: 11 Feb 201612 Feb 2016
Conference number: 2nd
https://ieeexplore.ieee.org/xpl/conhome/7587669/proceeding (Proceedings)


ConferenceAustralian Microwave Symposium 2016
Abbreviated titleAMS 2016
Internet address


  • Chipless RFID tag
  • MEMS

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