High-fidelity conformation of graphene to SiO2 topographic features

William G Cullen; Mahito Yamamoto; K M Burson; Jianhao -H Chen; C Jang; Michael Fuhrer; Ellen D Williams

doi:10.1103/PhysRevLett.105.215504

High-fidelity conformation of graphene to SiO2 topographic features

William G Cullen
, Mahito Yamamoto
, K M Burson
, Jianhao -H Chen
, C Jang
, Michael Fuhrer
, Ellen D Williams

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	1 - 4
Number of pages	4
Journal	Physical Review Letters
Volume	105
Issue number	21
DOIs	https://doi.org/10.1103/PhysRevLett.105.215504
Publication status	Published - 2010
Externally published	Yes

Access to Document

10.1103/PhysRevLett.105.215504

Cite this

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title = "High-fidelity conformation of graphene to SiO2 topographic features",

author = "Cullen, \{William G\} and Mahito Yamamoto and Burson, \{K M\} and Chen, \{Jianhao -H\} and C Jang and Michael Fuhrer and Williams, \{Ellen D\}",

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language = "English",

volume = "105",

pages = "1 -- 4",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

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AU - Cullen, William G

AU - Yamamoto, Mahito

AU - Burson, K M

AU - Chen, Jianhao -H

AU - Jang, C

AU - Fuhrer, Michael

AU - Williams, Ellen D

PY - 2010

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U2 - 10.1103/PhysRevLett.105.215504

DO - 10.1103/PhysRevLett.105.215504

M3 - Article

SN - 0031-9007

VL - 105

SP - 1

EP - 4

JO - Physical Review Letters

JF - Physical Review Letters

IS - 21

ER -