Original language | English |
---|---|
Pages (from-to) | 1 - 4 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 105 |
Issue number | 21 |
DOIs | |
Publication status | Published - 2010 |
Externally published | Yes |
High-fidelity conformation of graphene to SiO2 topographic features
William G Cullen, Mahito Yamamoto, K M Burson, Jianhao -H Chen, C Jang, Michael Fuhrer, Ellen D Williams
Research output: Contribution to journal › Article › Research › peer-review
120
Citations
(Scopus)