Hardness of k-LWE and applications in traitor tracing

San Ling, Duong Hieu Phan, Damien Noel Stehle, Ron Steinfeld

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

30 Citations (Scopus)

30 Citations
1 Article

1 results

2017

Hardness of k-LWE and Applications in Traitor Tracing
Ling, S., Phan, D. H., Stehlé, D. & Steinfeld, R., Dec 2017, In: Algorithmica. 79, 4, p. 1318-1352 35 p.
Research output: Contribution to journal › Article › Research › peer-review

4 Citations (Scopus)