Grain fragmentation in equal channel angular pressed copper

Chengfan Gu, Lazlo S. Toth, Benoit Beausir, Tim Williams, Chris Davies

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

4 Citations (Scopus)

Abstract

A comparative experimental and simulation study of oxygen-free high conductivity copper produced by equal channel angular pressing (ECAP) one-pass has been carried out by using electron backscatter diffraction (EBSD) and a recently proposed grain refinement model. The grain size and misorientation distributions were extracted from the EBSD measurements. It was found that the microstructure in the ECAP deformed copper was much more refined on the TD plane. The grain size observed experimentally can be fairly well predicted by the grain fragmentation model.
Original languageEnglish
Title of host publicationPRICM 7
Subtitle of host publicationPart 1
EditorsJian-Feng Nie, Allan Morton
Place of PublicationPfaffikon Switzerland
PublisherTrans Tech Publications
Pages1570-1573
Number of pages4
ISBN (Electronic)9783038133308
ISBN (Print)9780878492558
DOIs
Publication statusPublished - 2010
EventPacific Rim International Congress on Advanced Materials and Processing 2010 - Cairns Qld Australia, Cairns, Australia
Duration: 2 Aug 20106 Aug 2010
Conference number: 7th

Publication series

NameMaterials Science Forum
PublisherTrans Tech Publications
Volume654-656
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

ConferencePacific Rim International Congress on Advanced Materials and Processing 2010
Abbreviated titlePRICM-7
CountryAustralia
CityCairns
Period2/08/106/08/10

Keywords

  • UFG
  • Ultrafine-grained
  • Grain size
  • EBSD
  • Grain refinement

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