Getting more from the semiconductor test: data mining with defect-cluster extraction

Melanie Po-Leen Ooi, Kwang Joo Sim, Ye Chow Kuang, Serge Demidenko, Lindsay Kleeman, Chris Chan

Research output: Contribution to journalArticleResearchpeer-review

22 Citations (Scopus)
Original languageEnglish
Pages (from-to)3300 - 3317
Number of pages18
JournalIEEE Transactions on Instrumentation and Measurement
Volume60
Issue number10
DOIs
Publication statusPublished - 2011

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