Fundamentals of electron tomography & applications of electron tomography

Paul A Midgley, Matthew Weyland, Heiko Stegmann

Research output: Chapter in Book/Report/Conference proceeding › Chapter (Book) › Other

Original language	English
Title of host publication	Advanced Tomographic Methods in Materials Research and Engineering
Editors	John Banhart
Place of Publication	Oxford, UK
Publisher	Oxford University Press
Pages	305 - 372
Number of pages	68
Edition	1
ISBN (Print)	978-0-19-921324-5
Publication status	Published - 2008

Cite this

@inbook{539a0967fc5a487fac5ef8bf2a2c8ccc,

title = "Fundamentals of electron tomography & applications of electron tomography",

author = "Midgley, {Paul A} and Matthew Weyland and Heiko Stegmann",

year = "2008",

language = "English",

isbn = "978-0-19-921324-5",

pages = "305 -- 372",

editor = "John Banhart",

booktitle = "Advanced Tomographic Methods in Materials Research and Engineering",

publisher = "Oxford University Press",

address = "United Kingdom",

edition = "1",

}

Fundamentals of electron tomography & applications of electron tomography. / Midgley, Paul A; Weyland, Matthew; Stegmann, Heiko.
Advanced Tomographic Methods in Materials Research and Engineering. ed. / John Banhart. 1. ed. Oxford, UK: Oxford University Press, 2008. p. 305 - 372.

Research output: Chapter in Book/Report/Conference proceeding › Chapter (Book) › Other

TY - CHAP

T1 - Fundamentals of electron tomography & applications of electron tomography

AU - Midgley, Paul A

AU - Weyland, Matthew

AU - Stegmann, Heiko

PY - 2008

Y1 - 2008

M3 - Chapter (Book)

SN - 978-0-19-921324-5

SP - 305

EP - 372

BT - Advanced Tomographic Methods in Materials Research and Engineering

A2 - Banhart, John

PB - Oxford University Press

CY - Oxford, UK

ER -