Fundamental Resolution Limit in Scanning Transmission Electron Tomography from Beam Spreading

J. K. Hyun, P. Ercius, M. Weyland, D. A. Muller

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	1330-1331
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	13
Issue number	S02
DOIs	https://doi.org/10.1017/S1431927607075289
Publication status	Published - 1 Aug 2007

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title = "Fundamental Resolution Limit in Scanning Transmission Electron Tomography from Beam Spreading",

author = "Hyun, \{J. K.\} and P. Ercius and M. Weyland and Muller, \{D. A.\}",

year = "2007",

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language = "English",

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TY - JOUR

T1 - Fundamental Resolution Limit in Scanning Transmission Electron Tomography from Beam Spreading

AU - Hyun, J. K.

AU - Ercius, P.

AU - Weyland, M.

AU - Muller, D. A.

PY - 2007/8/1

Y1 - 2007/8/1

U2 - 10.1017/S1431927607075289

DO - 10.1017/S1431927607075289

M3 - Meeting Abstract

SN - 1431-9276

VL - 13

SP - 1330

EP - 1331

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S02

ER -