Fundamental Resolution Limit in Scanning Transmission Electron Tomography from Beam Spreading

J. K. Hyun, P. Ercius, M. Weyland, D. A. Muller

Research output: Contribution to journalMeeting Abstractpeer-review

Original languageEnglish
Pages (from-to)1330-1331
Number of pages2
JournalMicroscopy and Microanalysis
Volume13
Issue numberS02
DOIs
Publication statusPublished - 1 Aug 2007

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