Fundamental Resolution Limit in Scanning Transmission Electron Tomography from Beam Spreading

J. K. Hyun, P. Ercius, M. Weyland, D. A. Muller

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)1330-1331
Number of pages2
JournalMicroscopy and Microanalysis
Volume13
Issue numberS02
DOIs
Publication statusPublished - 1 Aug 2007

Cite this

Hyun, J. K. ; Ercius, P. ; Weyland, M. ; Muller, D. A. / Fundamental Resolution Limit in Scanning Transmission Electron Tomography from Beam Spreading. In: Microscopy and Microanalysis. 2007 ; Vol. 13, No. S02. pp. 1330-1331.
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Fundamental Resolution Limit in Scanning Transmission Electron Tomography from Beam Spreading. / Hyun, J. K.; Ercius, P.; Weyland, M.; Muller, D. A.

In: Microscopy and Microanalysis, Vol. 13, No. S02, 01.08.2007, p. 1330-1331.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Fundamental Resolution Limit in Scanning Transmission Electron Tomography from Beam Spreading

AU - Hyun, J. K.

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AU - Weyland, M.

AU - Muller, D. A.

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