Frontiers of electron microscopy in materials science

Research output: Contribution to journalEditorialOtherpeer-review

Original languageEnglish
Pages (from-to)999-1000
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number4
DOIs
Publication statusPublished - 1 Aug 2014
EventFrontiers of Electron Microscopy in Materials Science - Granlibakken Conference Center and Lodge, Lake Tahoe, United States of America
Duration: 13 Sep 201518 Sep 2015
Conference number: 15
http://femms2015.ucdavis.edu/

Cite this

@article{a1b16f1d7b7e4aa8bc35a204570091d4,
title = "Frontiers of electron microscopy in materials science",
author = "Scott Findlay and Philip Nakashima and Matthew Weyland",
year = "2014",
month = "8",
day = "1",
doi = "10.1017/S1431927614012835",
language = "English",
volume = "20",
pages = "999--1000",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "4",

}

Frontiers of electron microscopy in materials science. / Findlay, Scott; Nakashima, Philip; Weyland, Matthew.

In: Microscopy and Microanalysis, Vol. 20, No. 4, 01.08.2014, p. 999-1000.

Research output: Contribution to journalEditorialOtherpeer-review

TY - JOUR

T1 - Frontiers of electron microscopy in materials science

AU - Findlay, Scott

AU - Nakashima, Philip

AU - Weyland, Matthew

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84911008684&partnerID=8YFLogxK

U2 - 10.1017/S1431927614012835

DO - 10.1017/S1431927614012835

M3 - Editorial

VL - 20

SP - 999

EP - 1000

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 4

ER -