Frontiers of electron microscopy in materials science

Scott Findlay; Philip Nakashima; Matthew Weyland

doi:10.1017/S1431927614012835

Frontiers of electron microscopy in materials science

Scott Findlay, Philip Nakashima, Matthew Weyland

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	999-1000
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	4
DOIs	https://doi.org/10.1017/S1431927614012835
Publication status	Published - 1 Aug 2014
Event	Frontiers of Electron Microscopy in Materials Science 2013 - Mantra Lorne, Lorne, Australia Duration: 8 Sept 2013 → 13 Sept 2013 Conference number: 14th

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10.1017/S1431927614012835

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@article{a1b16f1d7b7e4aa8bc35a204570091d4,

title = "Frontiers of electron microscopy in materials science",

author = "Scott Findlay and Philip Nakashima and Matthew Weyland",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614012835",

language = "English",

volume = "20",

pages = "999--1000",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "4",

note = "Frontiers of Electron Microscopy in Materials Science 2013, FEMMS ; Conference date: 08-09-2013 Through 13-09-2013",

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TY - JOUR

T1 - Frontiers of electron microscopy in materials science

AU - Findlay, Scott

AU - Nakashima, Philip

AU - Weyland, Matthew

N1 - Conference code: 14th

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84911008684&partnerID=8YFLogxK

U2 - 10.1017/S1431927614012835

DO - 10.1017/S1431927614012835

M3 - Meeting Abstract

C2 - 24992830

AN - SCOPUS:84911008684

SN - 1431-9276

VL - 20

SP - 999

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 4

T2 - Frontiers of Electron Microscopy in Materials Science 2013

Y2 - 8 September 2013 through 13 September 2013

ER -

Frontiers of electron microscopy in materials science

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Frontiers of electron microscopy in materials science

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