| Original language | English |
|---|---|
| Pages (from-to) | 999-1000 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 20 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1 Aug 2014 |
| Event | Frontiers of Electron Microscopy in Materials Science - Granlibakken Conference Center and Lodge, Lake Tahoe, United States of America Duration: 13 Sep 2015 → 18 Sep 2015 Conference number: 15 http://femms2015.ucdavis.edu/ |
Cite this
@article{a1b16f1d7b7e4aa8bc35a204570091d4,
title = "Frontiers of electron microscopy in materials science",
author = "Scott Findlay and Philip Nakashima and Matthew Weyland",
year = "2014",
month = "8",
day = "1",
doi = "10.1017/S1431927614012835",
language = "English",
volume = "20",
pages = "999--1000",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "4",
}
Findlay, S, Nakashima, P & Weyland, M 2014, 'Frontiers of electron microscopy in materials science', Microscopy and Microanalysis, vol. 20, no. 4, pp. 999-1000. https://doi.org/10.1017/S1431927614012835
Frontiers of electron microscopy in materials science. / Findlay, Scott; Nakashima, Philip; Weyland, Matthew.
In: Microscopy and Microanalysis, Vol. 20, No. 4, 01.08.2014, p. 999-1000.Research output: Contribution to journal › Editorial › Other › peer-review
TY - JOUR
T1 - Frontiers of electron microscopy in materials science
AU - Findlay, Scott
AU - Nakashima, Philip
AU - Weyland, Matthew
PY - 2014/8/1
Y1 - 2014/8/1
UR - http://www.scopus.com/inward/record.url?scp=84911008684&partnerID=8YFLogxK
U2 - 10.1017/S1431927614012835
DO - 10.1017/S1431927614012835
M3 - Editorial
VL - 20
SP - 999
EP - 1000
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
SN - 1431-9276
IS - 4
ER -