Fault-tolerance in micro programmed control: architectures & schematic synthesis

Serge Demidenko; Eugene Levine; Vincenzo Piuri; Gourab Sen Gupta

Fault-tolerance in micro programmed control: architectures & schematic synthesis

Serge Demidenko, Eugene Levine, Vincenzo Piuri, Gourab Sen Gupta

Electrical and Computer Systems Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	IMTC/05 - Processings of the IEEE Instrumentation and Measurement Technology Conference
Editors	E Petriu, et al
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	305 - 310
Number of pages	6
Volume	1
ISBN (Print)	0-7803-8880-1
Publication status	Published - 2005
Event	IEEE International Instrumentation and Measurement Technology Conference 2005 - Ottawa, Canada Duration: 16 May 2005 → 19 May 2005 Conference number: 22nd https://ieeexplore.ieee.org/xpl/conhome/10678/proceeding?isnumber=33710 (Proceedings)

Conference

Conference	IEEE International Instrumentation and Measurement Technology Conference 2005
Abbreviated title	I2MTC 2005
Country/Territory	Canada
City	Ottawa
Period	16/05/05 → 19/05/05
Internet address	https://ieeexplore.ieee.org/xpl/conhome/10678/proceeding?isnumber=33710 (Proceedings)

Cite this

@inproceedings{f12640f65ba64ddeb7b1339f29f6b07e,

title = "Fault-tolerance in micro programmed control: architectures & schematic synthesis",

author = "Serge Demidenko and Eugene Levine and Vincenzo Piuri and Gupta, {Gourab Sen}",

year = "2005",

language = "English",

isbn = "0-7803-8880-1",

volume = "1",

pages = "305 -- 310",

editor = "E Petriu and {et al}",

booktitle = "IMTC/05 - Processings of the IEEE Instrumentation and Measurement Technology Conference",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE International Instrumentation and Measurement Technology Conference 2005, I2MTC 2005 ; Conference date: 16-05-2005 Through 19-05-2005",

url = "https://ieeexplore.ieee.org/xpl/conhome/10678/proceeding?isnumber=33710",

}

Demidenko, S, Levine, E, Piuri, V & Gupta, GS 2005, Fault-tolerance in micro programmed control: architectures & schematic synthesis. in E Petriu & et al (eds), IMTC/05 - Processings of the IEEE Instrumentation and Measurement Technology Conference. vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 305 - 310, IEEE International Instrumentation and Measurement Technology Conference 2005, Ottawa, Ontario, Canada, 16/05/05.

Fault-tolerance in micro programmed control: architectures & schematic synthesis. / Demidenko, Serge; Levine, Eugene; Piuri, Vincenzo et al.
IMTC/05 - Processings of the IEEE Instrumentation and Measurement Technology Conference. ed. / E Petriu; et al. Vol. 1 USA: IEEE, Institute of Electrical and Electronics Engineers, 2005. p. 305 - 310.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Fault-tolerance in micro programmed control: architectures & schematic synthesis

AU - Demidenko, Serge

AU - Levine, Eugene

AU - Piuri, Vincenzo

AU - Gupta, Gourab Sen

N1 - Conference code: 22nd

PY - 2005

Y1 - 2005

M3 - Conference Paper

SN - 0-7803-8880-1

VL - 1

SP - 305

EP - 310

BT - IMTC/05 - Processings of the IEEE Instrumentation and Measurement Technology Conference

A2 - Petriu, E

A2 - et al, null

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - IEEE International Instrumentation and Measurement Technology Conference 2005

Y2 - 16 May 2005 through 19 May 2005

ER -