Abstract
The DIAMOND beamline I13L is dedicated to multi-scale and multi-modal imaging in real and reciprocal space. The beamline consists of two independently operating experimental stations, located at a distance of more than 200 m from the source. The Imaging Branch performs micro-tomography with in-line phase contrast in the 6-30 keV energy range. In addition, a grating interferometry setup and a full-field microscope for nano-tomography are currently implemented. Other techniques providing high-resolution three-dimensional information, in particular coherent X-ray diffraction, are hosted on the Coherence Branch. All imaging methods are tested to operate with large energy bandwidths and therefore shorter exposure times. To this end, two options are currently used: the so-called 'pink-beam' mode using a reflecting mirror and X-ray filters and monochromatic mode using a multilayer monochromator. The operation mode enables science for in-situ and operando studies across a wide range of scientific areas.
Original language | English |
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Title of host publication | Proceedings of SPIE |
Subtitle of host publication | Developments in X-Ray Tomography XII |
Editors | Bert Muller, Ge Wang |
Place of Publication | Bellingham WA USA |
Publisher | SPIE - International Society for Optical Engineering |
Number of pages | 8 |
Volume | 11113 |
ISBN (Electronic) | 9781510629196 |
ISBN (Print) | 9781510629196 |
DOIs | |
Publication status | Published - 1 Oct 2019 |
Externally published | Yes |
Event | Developments in X-ray Tomography 2019 - San Diego, United States of America Duration: 11 Aug 2019 → 15 Aug 2019 Conference number: 12th |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 11113 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Developments in X-ray Tomography 2019 |
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Country/Territory | United States of America |
City | San Diego |
Period | 11/08/19 → 15/08/19 |
Keywords
- Bragg-CDI
- Nano-imaging
- Phase contrast
- Pink-beam
- Ptychography
- Synchrotron radiation
- Tomography
- X-ray microscopy