Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy

Changlin Zheng, Ye Zhu, Sorin Lazar, Joanne Etheridge

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)1 - 5
Number of pages5
JournalPhysical Review Letters
Volume112
Issue number16
DOIs
Publication statusPublished - 2014

Cite this

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title = "Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy",
author = "Changlin Zheng and Ye Zhu and Sorin Lazar and Joanne Etheridge",
year = "2014",
doi = "10.1103/PhysRevLett.112.166101",
language = "English",
volume = "112",
pages = "1 -- 5",
journal = "Physical Review Letters",
issn = "0031-9007",
publisher = "APS",
number = "16",

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Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy. / Zheng, Changlin; Zhu, Ye; Lazar, Sorin; Etheridge, Joanne.

In: Physical Review Letters, Vol. 112, No. 16, 2014, p. 1 - 5.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy

AU - Zheng, Changlin

AU - Zhu, Ye

AU - Lazar, Sorin

AU - Etheridge, Joanne

PY - 2014

Y1 - 2014

UR - http://journals.aps.org/prl/pdf/10.1103/PhysRevLett.112.166101

U2 - 10.1103/PhysRevLett.112.166101

DO - 10.1103/PhysRevLett.112.166101

M3 - Article

VL - 112

SP - 1

EP - 5

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 16

ER -