Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education

Moi Tin Chew, Serge Demidenko, Melanie Po Leen Ooi, Ye Chow Kuang

    Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

    5 Citations (Scopus)

    Abstract

    This paper presents a set of low-cost desktop IC test systems developed for engineering education. The set is implemented using the National Instrument (NI) Educational Laboratory Virtual Instrumentation Suite (ELVIS) and custom-made load boards. The software is based on the NI LabVIEW development environment. The set has been developed and employed for teaching electronic testing, instrumentation and measurement, and advanced electronic circuits courses within several undergraduate and graduate engineering programs at three universities in Malaysia, Vietnam, and New Zealand.

    Original languageEnglish
    Title of host publication2017 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2017 - Proceedings
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages165-170
    Number of pages6
    ISBN (Electronic)9781509042524
    DOIs
    Publication statusPublished - 28 Jul 2017
    EventIEEE International Conference on Computational Intelligence for Measurement Systems and Applications 2017 - Annecy, France
    Duration: 26 Jun 201728 Jun 2017
    http://2017.civemsa.ieee-ims.org/

    Conference

    ConferenceIEEE International Conference on Computational Intelligence for Measurement Systems and Applications 2017
    Abbreviated titleCIVEMSA 2017
    CountryFrance
    CityAnnecy
    Period26/06/1728/06/17
    Internet address

    Keywords

    • Analog Test
    • Digital Test
    • Electronic Testing
    • Engineering Education
    • Memory Test
    • Virtual Instrumentation

    Cite this

    Chew, M. T., Demidenko, S., Ooi, M. P. L., & Kuang, Y. C. (2017). Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education. In 2017 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2017 - Proceedings (pp. 165-170). [7995320] IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CIVEMSA.2017.7995320