Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education

Moi Tin Chew, Serge Demidenko, Melanie Po Leen Ooi, Ye Chow Kuang

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

7 Citations (Scopus)

Abstract

This paper presents a set of low-cost desktop IC test systems developed for engineering education. The set is implemented using the National Instrument (NI) Educational Laboratory Virtual Instrumentation Suite (ELVIS) and custom-made load boards. The software is based on the NI LabVIEW development environment. The set has been developed and employed for teaching electronic testing, instrumentation and measurement, and advanced electronic circuits courses within several undergraduate and graduate engineering programs at three universities in Malaysia, Vietnam, and New Zealand.

Original languageEnglish
Title of host publication2017 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2017 - Proceedings
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages165-170
Number of pages6
ISBN (Electronic)9781509042524
DOIs
Publication statusPublished - 28 Jul 2017
EventIEEE International Conference on Computational Intelligence for Measurement Systems and Applications 2017 - Annecy, France
Duration: 26 Jun 201728 Jun 2017
http://2017.civemsa.ieee-ims.org/

Conference

ConferenceIEEE International Conference on Computational Intelligence for Measurement Systems and Applications 2017
Abbreviated titleCIVEMSA 2017
Country/TerritoryFrance
CityAnnecy
Period26/06/1728/06/17
Internet address

Keywords

  • Analog Test
  • Digital Test
  • Electronic Testing
  • Engineering Education
  • Memory Test
  • Virtual Instrumentation

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