Abstract
This paper presents a set of low-cost desktop IC test systems developed for engineering education. The set is implemented using the National Instrument (NI) Educational Laboratory Virtual Instrumentation Suite (ELVIS) and custom-made load boards. The software is based on the NI LabVIEW development environment. The set has been developed and employed for teaching electronic testing, instrumentation and measurement, and advanced electronic circuits courses within several undergraduate and graduate engineering programs at three universities in Malaysia, Vietnam, and New Zealand.
Original language | English |
---|---|
Title of host publication | 2017 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2017 - Proceedings |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 165-170 |
Number of pages | 6 |
ISBN (Electronic) | 9781509042524 |
DOIs | |
Publication status | Published - 28 Jul 2017 |
Event | IEEE International Conference on Computational Intelligence for Measurement Systems and Applications 2017 - Annecy, France Duration: 26 Jun 2017 → 28 Jun 2017 http://2017.civemsa.ieee-ims.org/ |
Conference
Conference | IEEE International Conference on Computational Intelligence for Measurement Systems and Applications 2017 |
---|---|
Abbreviated title | CIVEMSA 2017 |
Country/Territory | France |
City | Annecy |
Period | 26/06/17 → 28/06/17 |
Internet address |
Keywords
- Analog Test
- Digital Test
- Electronic Testing
- Engineering Education
- Memory Test
- Virtual Instrumentation